30 June 1989 Trends In Scene Generation Technology: Calibration To Functional Testing
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Proceedings Volume 1050, Infrared Systems and Components III; (1989); doi: 10.1117/12.951438
Event: OE/LASE '89, 1989, Los Angeles, CA, United States
Abstract
Scene generation requirements are continually driven by increasingly complex threat and seeker/sensor hardware. Improvements in testing technology, which traditionally lag the development of new devices, have progressed significantly in recent years. The cost of extensive flight testing of surveillance and interceptor devices has given renewed interest to functional testing in a laboratory environment. Scene complexity has had to be greatly expanded to meet this need. Calibration curves are no longer sufficient to meet the growing needs of functional testing. This paper traces the historical development of LWIR sensor/seeker scene generation and projection technology. Electronic, all-digital and inband techniques are included.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Donald E. Parker, Don G. Taylor, C. T. Wallace, "Trends In Scene Generation Technology: Calibration To Functional Testing", Proc. SPIE 1050, Infrared Systems and Components III, (30 June 1989); doi: 10.1117/12.951438; http://dx.doi.org/10.1117/12.951438
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KEYWORDS
Infrared imaging

Sensors

Infrared radiation

Projection systems

Calibration

Long wavelength infrared

Metals

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