Presentation + Paper
23 February 2018 Surface plasmon holographic microscopy for near-field refractive index detection and thin film mapping
Jianlin Zhao, Jiwei Zhang, Siqing Dai, Jianglei Di, Teli Xi
Author Affiliations +
Proceedings Volume 10503, Quantitative Phase Imaging IV; 1050316 (2018) https://doi.org/10.1117/12.2288712
Event: SPIE BiOS, 2018, San Francisco, California, United States
Abstract
Surface plasmon microscopy (SPM) is widely applied for label-free detection of changes of refractive index and concentration, as well as mapping thin films in near field. Traditionally, the SPM systems are based on the detection of light intensity or phase changes. Here, we present two kinds of surface plasmon holographic microscopy (SPHM) systems for amplitude- and phase-contrast imaging simultaneously. Through recording off-axis holograms and numerical reconstruction, the complex amplitude distributions of surface plasmon resonance (SPR) images can be obtained. According to the Fresnel’s formula, in a prism/ gold/ dielectric structure, the reflection phase shift is uniquely decided by refractive index of the dielectric. By measuring the phase shift difference of the reflected light exploiting prism-coupling SPHM system based on common-path interference configuration, monitoring tiny refractive index variation and imaging biological tissue are performed. Furthermore, to characterize the thin film thickness in near field, we employ a four-layer SPR model in which the third film layer is within the evanescent field. The complex reflection coefficient, including the reflectivity and reflection phase shift, is uniquely decided by the film thickness. By measuring the complex amplitude distributions of the SPR images exploiting objective-coupling SPHM system based on common-path interference configuration, the thickness distributions of thin films are mapped with sub-nanometer resolution theoretically. Owing to its high temporal stability, the recommended SPHMs show great potentials for monitoring tiny refractive index variations, imaging biological tissues and mapping thin films in near field with dynamic, nondestructive and full-field measurement capabilities in chemistry, biomedicine field, etc.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jianlin Zhao, Jiwei Zhang, Siqing Dai, Jianglei Di, and Teli Xi "Surface plasmon holographic microscopy for near-field refractive index detection and thin film mapping", Proc. SPIE 10503, Quantitative Phase Imaging IV, 1050316 (23 February 2018); https://doi.org/10.1117/12.2288712
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KEYWORDS
Reflection

Refractive index

Phase shifts

Thin films

Near field

Dielectrics

Holography

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