23 February 2018 Shaping the light for the investigation of depth-extended scattering media
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Proceedings Volume 10503, Quantitative Phase Imaging IV; 1050318 (2018) https://doi.org/10.1117/12.2296582
Event: SPIE BiOS, 2018, San Francisco, California, United States
Abstract
Scattering media are an ongoing challenge for all kind of imaging technologies including coherent and incoherent principles. Inspired by new approaches of computational imaging and supported by the availability of powerful computers, spatial light modulators, light sources and detectors, a variety of new methods ranging from holography to time-of-flight imaging, phase conjugation, phase recovery using iterative algorithms and correlation techniques have been introduced and applied to different types of objects. However, considering the obvious progress in this field, several problems are still matter of investigation and their solution could open new doors for the inspection and application of scattering media as well. In particular, these open questions include the possibility of extending the 2d-approach to the inspection of depth-extended objects, the direct use of a scattering media as a simple tool for imaging of complex objects and the improvement of coherent inspection techniques for the dimensional characterization of incoherently radiating spots embedded in scattering media. In this paper we show our recent findings in coping with these challenges. First we describe how to explore depth-extended objects by means of a scattering media. Afterwards, we extend this approach by implementing a new type of microscope making use of a simple scatter plate as a kind of flat and unconventional imaging lens. Finally, we introduce our shearing interferometer in combination with structured illumination for retrieving the axial position of fluorescent light emitting spots embedded in scattering media.
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W. Osten, K. Frenner, G. Pedrini, A. K. Singh, J. Schindler, M. Takeda, "Shaping the light for the investigation of depth-extended scattering media", Proc. SPIE 10503, Quantitative Phase Imaging IV, 1050318 (23 February 2018); doi: 10.1117/12.2296582; https://doi.org/10.1117/12.2296582
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