23 February 2018 Speckle-free inherently-phased synthetic aperture microscopy with coherent illumination
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Proceedings Volume 10503, Quantitative Phase Imaging IV; 1050319 (2018) https://doi.org/10.1117/12.2290940
Event: SPIE BiOS, 2018, San Francisco, California, United States
Abstract
We present an inherently phased synthetic aperture microscopy method to mitigate speckle noise and frame- phasing-related issues affecting existing systems that employ coherent illumination for maximum phase sensitivity. Instead of digital holography, our method uses a vibration-insensitive, common-path, phase-shifting shearing interferometer to detect the phase gradient vector and the amplitude of the optical field at the image plane of the microscope. The stability of the speckle field seen by the sensor allows coherent speckle compensation. For demonstration, we show speckle-free super-resolved reconstructions of polystyrene beads in index matching microscope oil.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Remy Tumbar, Remy Tumbar, } "Speckle-free inherently-phased synthetic aperture microscopy with coherent illumination", Proc. SPIE 10503, Quantitative Phase Imaging IV, 1050319 (23 February 2018); doi: 10.1117/12.2290940; https://doi.org/10.1117/12.2290940
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