To reach the goal described above, in a first step measurement/characterization technologies concerning their suitability to generate a precise digital twin of an existing optical system have to be identified and evaluated. This paper gives an overview of possible characterization methods and, finally, shows first results of evaluated, compared methods (e.g. spot-radius, MTF, Zernike-polynomials), to create a DOT. The focus initially lies on the unequivocalness of the optimization results as well as on the computational time required for the optimization to reach the characterized system state. Possible sources of error are the measurement accuracy (to characterize the system) , execution time of the measurement, time needed to map the digital to the physical world (optimization step) as well as interface possibilities to integrate the measurement tool into an assembly cell. Moreover, it is to be discussed whether the used measurement methods are suitable for a ‘seamless’ integration into an assembly cell.
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Marcel Prochnau, Michael Holzbrink, Wenxin Wang, Martin Holters, Jochen Stollenwerk, Peter Loosen, "Measurement methods to build up the digital optical twin," Proc. SPIE 10513, Components and Packaging for Laser Systems IV, 105131I (20 February 2018);