Here, we investigate the performance and robustness of a SESAM-modelocked VECSEL system under intense pulse intensity excitation. The effect of the degradation on the VECSEL performance is investigated using the SESAM in a VECSEL cavity supporting ultrashort pulses, while the degradation mechanism was investigated by exciting the SESAMs with an external femtosecond laser source. The decay of the photoluminescence (PL) and reflectivity under high excitation was monitored and the damaged samples were further analyzed using a thorough Transmission Electron Microscopy (TEM) analysis. It is found that the major contribution to the degradation is the field intensity and that the compositional damage is confined to the DBR region of the SESAM.
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Sadhvikas Addamane, Darryl Shima, Alexandre Laurain, Hsiu-Ting Chan, Ganesh Balakrishnan, Jerome V. Moloney, "Degradation mechanism of SESAMs under intense ultrashort pulses in modelocked VECSELs," Proc. SPIE 10515, Vertical External Cavity Surface Emitting Lasers (VECSELs) VIII, 105150T (15 February 2018);