Reliability testing of ultra-low noise InGaAs quad photoreceivers

Abhay M. Joshi; Shubhashish Datta; Narasimha Prasad; Michael Sivertz

doi:10.1117/12.2293010

23 February 2018 Reliability testing of ultra-low noise InGaAs quad photoreceivers

Abhay M. Joshi; Shubhashish Datta; Narasimha Prasad; Michael Sivertz

Author Affiliations +

Proceedings Volume 10526, Physics and Simulation of Optoelectronic Devices XXVI; 105261J (2018) https://doi.org/10.1117/12.2293010
Event: SPIE OPTO, 2018, San Francisco, California, United States

Abstract

We have developed ultra-low noise quadrant InGaAs photoreceivers for multiple applications ranging from Laser Interferometric Gravitional Wave Detection, to 3D Wind Profiling. Devices with diameters of 0.5 mm, 1mm, and 2 mm were processed, with the nominal capacitance of a single quadrant of a 1 mm quad photodiode being 2.5 pF. The 1 mm diameter InGaAs quad photoreceivers, using a low-noise, bipolar-input OpAmp circuitry exhibit an equivalent input noise per quadrant of <1.7 pA/√Hz in 2 to 20 MHz frequency range. The InGaAs Quad Photoreceivers have undergone the following reliability tests: 30 MeV Proton Radiation up to a Total Ionizing Dose (TID) of 50 krad, Mechanical Shock, and Sinusoidal Vibration.

Conference Presentation

Citation Download Citation

Abhay M. Joshi, Abhay M. Joshi, Shubhashish Datta, Shubhashish Datta, Narasimha Prasad, Narasimha Prasad, Michael Sivertz, Michael Sivertz, } "Reliability testing of ultra-low noise InGaAs quad photoreceivers", Proc. SPIE 10526, Physics and Simulation of Optoelectronic Devices XXVI, 105261J (23 February 2018); doi: 10.1117/12.2293010; https://doi.org/10.1117/12.2293010

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