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23 February 2018Reliability testing of ultra-low noise InGaAs quad photoreceivers
Abhay M. Joshi,1 Shubhashish Datta,1 Narasimha Prasad,2 Michael Sivertz3
1Discovery Semiconductors, Inc. (United States) 2NASA Langley Research Ctr. (United States) 3NASA Space Radiation Lab., Brookhaven National Lab. (United States)
We have developed ultra-low noise quadrant InGaAs photoreceivers for multiple applications ranging from Laser Interferometric Gravitional Wave Detection, to 3D Wind Profiling. Devices with diameters of 0.5 mm, 1mm, and 2 mm were processed, with the nominal capacitance of a single quadrant of a 1 mm quad photodiode being 2.5 pF. The 1 mm diameter InGaAs quad photoreceivers, using a low-noise, bipolar-input OpAmp circuitry exhibit an equivalent input noise per quadrant of <1.7 pA/√Hz in 2 to 20 MHz frequency range. The InGaAs Quad Photoreceivers have undergone the following reliability tests: 30 MeV Proton Radiation up to a Total Ionizing Dose (TID) of 50 krad, Mechanical Shock, and Sinusoidal Vibration.
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Abhay M. Joshi, Shubhashish Datta, Narasimha Prasad, Michael Sivertz, "Reliability testing of ultra-low noise InGaAs quad photoreceivers," Proc. SPIE 10526, Physics and Simulation of Optoelectronic Devices XXVI, 105261J (23 February 2018); https://doi.org/10.1117/12.2293010