Reliability testing of ultra-low noise InGaAs quad photoreceivers

Abhay M. Joshi; Shubhashish Datta; Narasimha Prasad; Michael Sivertz

doi:10.1117/12.2293010

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23 February 2018 Reliability testing of ultra-low noise InGaAs quad photoreceivers

Abhay M. Joshi, Shubhashish Datta, Narasimha Prasad, Michael Sivertz

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Proceedings Volume 10526, Physics and Simulation of Optoelectronic Devices XXVI; 105261J (2018) https://doi.org/10.1117/12.2293010
Event: SPIE OPTO, 2018, San Francisco, California, United States

Abstract

We have developed ultra-low noise quadrant InGaAs photoreceivers for multiple applications ranging from Laser Interferometric Gravitional Wave Detection, to 3D Wind Profiling. Devices with diameters of 0.5 mm, 1mm, and 2 mm were processed, with the nominal capacitance of a single quadrant of a 1 mm quad photodiode being 2.5 pF. The 1 mm diameter InGaAs quad photoreceivers, using a low-noise, bipolar-input OpAmp circuitry exhibit an equivalent input noise per quadrant of <1.7 pA/√Hz in 2 to 20 MHz frequency range. The InGaAs Quad Photoreceivers have undergone the following reliability tests: 30 MeV Proton Radiation up to a Total Ionizing Dose (TID) of 50 krad, Mechanical Shock, and Sinusoidal Vibration.

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Abhay M. Joshi, Shubhashish Datta, Narasimha Prasad, and Michael Sivertz "Reliability testing of ultra-low noise InGaAs quad photoreceivers", Proc. SPIE 10526, Physics and Simulation of Optoelectronic Devices XXVI, 105261J (23 February 2018); https://doi.org/10.1117/12.2293010

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