22 February 2018 Attenuation measurements in single-crystal sapphire fiber via Raman scattering intensity
Author Affiliations +
Proceedings Volume 10528, Optical Components and Materials XV; 105280U (2018) https://doi.org/10.1117/12.2291907
Event: SPIE OPTO, 2018, San Francisco, California, United States
Abstract
Performing attenuation measurements in unclad single crystal sapphire fiber has traditionally been accomplished through use the cutback method. Because single-crystal sapphire fibers do not cleave easily like silica fibers, this method requires repeated cutting and polishing of the sapphire fiber sample; which is very time consuming and introduces uncertainty in each loss measurement. In this paper, we present a new method to measure attenuation in sapphire or other single-crystal fibers based on distributed sapphire Raman optical time domain reflectometry (OTDR). This method is both nondestructive, significantly faster than the cutback method, and capable of measuring the local loss along the entire length of the fiber.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. Liu, M. Buric, B. Chorpening, A. Wang, Z. Yu, D. Homa, Y. Cheng, C. Hill, G. Pickrell, "Attenuation measurements in single-crystal sapphire fiber via Raman scattering intensity", Proc. SPIE 10528, Optical Components and Materials XV, 105280U (22 February 2018); doi: 10.1117/12.2291907; https://doi.org/10.1117/12.2291907
PROCEEDINGS
8 PAGES + PRESENTATION

SHARE
Back to Top