23 February 2018 Non-contact temperature Raman measurement in YSZ and alumina ceramics
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Proceedings Volume 10533, Oxide-based Materials and Devices IX; 1053325 (2018) https://doi.org/10.1117/12.2291944
Event: SPIE OPTO, 2018, San Francisco, California, United States
Yttria-stabilized zirconia (YSZ: ZrO2 + Y2O3) and alumina (Al2O3) are widely used in high-temperature applications due to their high-temperature stability, low thermal conductivity, and chemical inertness. Alumina is used extensively in engineered ceramic applications such as furnace tubes and thermocouple protection tubes, while YSZ is commonly used in thermal barrier coatings on turbine blades. Because they are already often found in high temperature and combustion applications, these two substances have been compared as candidates for Raman thermometry in high-temperature energy-related applications. Both ceramics were used with as-received rough surfaces, i.e., without polishing or modification. This closely approximates surface conditions in practical high-temperature situations. A single-line argon ion laser at 488nm was used to excite the materials inside a cylindrical furnace while measuring Raman spectra with a fixed-grating spectrometer. The shift in the peak positions of the most intense A1g peak at 418cm-1 (room temperature position) of alumina ceramic and relatively more symmetric Eg peak at 470cm-1 (room temperature position) of YSZ were measured and reported along with a thermocouple-derived reference temperature up to about 1000°C. This study showed that alumina and YSZ ceramics can be used in high-temperature Raman thermometry with an accuracy of 4.54°C and 10.5°C average standard deviations respectively over the range of about 1000°C. We hope that this result will guide future researchers in selecting materials and utilizing Raman non-contact temperature measurements in harsh environments.
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Juddha Thapa, Juddha Thapa, Benjamin T. Chorpening, Benjamin T. Chorpening, Michael P. Buric, Michael P. Buric, } "Non-contact temperature Raman measurement in YSZ and alumina ceramics ", Proc. SPIE 10533, Oxide-based Materials and Devices IX, 1053325 (23 February 2018); doi: 10.1117/12.2291944; https://doi.org/10.1117/12.2291944

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