23 February 2018 True resolution enhancement for optical spectroscopy
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Abstract
Resolving spectrally adjacent peaks is important for techniques, such as tracking small shifts in Raman or fluorescence spectra, quantifying pharmaceutical polymorph ratios, or molecular orientation studies. Thus, suitable spectral resolution is a vital consideration when designing most spectroscopic systems. Most parameters that influence spectral resolution are fixed for a given system (spectrometer length, grating groove density, excitation source, CCD pixel size, etc.). Inflexible systems are non-problematic if the spectrometer is dedicated for a single purpose; however, these specifications cannot be optimized for different applications with wider range resolution requirements. Data processing techniques, including peak fitting, partial least squares, or principal component analysis, are typically used to achieve sub-optical resolution information. These techniques can be plagued by spectral artifacts introduced by post-processing as well as the subjective implementation of statistical parameters. TruRes™, from Andor Technology, uses an innovative optical means to greatly improve and expand the range of spectral resolutions accessible on a single setup. True spectral resolution enhancement of >30% is achieved without mathematical spectral alteration, dataprocessing, or spectrometer component changes. Discreet characteristic spectral lines from Laser-Induced Breakdown Spectroscopy (LIBS) and atomic calibration sources are now fully resolved from spectrally-adjacent peaks under otherwise identical configuration. TruRes™ has added advantage of increasing the spectral resolution without sacrificing bandpass. Using TruRes™ the Kymera 328i resolution can approach that of a 500 mm focal spectrometer. Furthermore, the bandpass of a 500 mm spectrograph with would be 50% narrower than the Kymera 328i with all other spectrometer components constant. However, the Kymera 328i with TruRes™ is able to preserve a 50% wider bandpass.
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Justin T. Cooper, Jeffrey B. Oleske, "True resolution enhancement for optical spectroscopy", Proc. SPIE 10535, Integrated Optics: Devices, Materials, and Technologies XXII, 1053525 (23 February 2018); doi: 10.1117/12.2290581; https://doi.org/10.1117/12.2290581
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