22 February 2018 Fast and broadband detector for laser radiation
Author Affiliations +
Proceedings Volume 10539, Photonic Instrumentation Engineering V; 105390I (2018) https://doi.org/10.1117/12.2294002
Event: SPIE OPTO, 2018, San Francisco, California, United States
Abstract
We developed a fast detector (patent pending) based on the Laser Induced Transverse Voltage (LITV) effect. The advantage of detectors using the LITV effect over pyroelectric sensors and photodiodes for laser radiation measurements is the combination of an overall fast response time, broadband spectral acceptance, high saturation threshold to direct laser irradiation and the possibility to measure pulsed as well as cw-laser sources.

The detector is capable of measuring the energy of single laser pulses with repetition frequencies up to the MHz range, adding the possibility to also measure the output power of cw-lasers.

Moreover, the thermal nature of the sensor enables the capability to work in a broadband spectrum, from UV to THz as well as the possibility of operating in a broad-range (10-3-102 W/cm2 ) of incident average optical power densities of the laser radiation, without the need of adopting optical filters nor other precautions.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Davide Scorticati, Giacomo Crapella, Sergio Pellegrino, "Fast and broadband detector for laser radiation", Proc. SPIE 10539, Photonic Instrumentation Engineering V, 105390I (22 February 2018); doi: 10.1117/12.2294002; https://doi.org/10.1117/12.2294002
PROCEEDINGS
7 PAGES + PRESENTATION

SHARE
RELATED CONTENT

IR detector system for the GERB instrument
Proceedings of SPIE (November 18 1998)
Z Backlighter facility upgrades a path to short long...
Proceedings of SPIE (June 09 2011)
Infrared Fiber Early Warning Receiver
Proceedings of SPIE (December 17 1982)
Photoemf of hot carriers in nonuniform GaAs
Proceedings of SPIE (February 06 1997)
Laser radiometry for UV lasers at 193 nm
Proceedings of SPIE (May 30 2003)

Back to Top