22 February 2018 Comparative analysis of methods and optical-electronic equipment to control the form parameters of spherical mirrors
Author Affiliations +
Proceedings Volume 10539, Photonic Instrumentation Engineering V; 105390Z (2018) https://doi.org/10.1117/12.2297078
Event: SPIE OPTO, 2018, San Francisco, California, United States
In this paper we consider two approaches widely used in testing of spherical optical surfaces: Fizeau interferometer and Shack-Hartmann wavefront sensor. Fizeau interferometer that is widely used in optical testing can be transformed to a device using Shack-Hartmann wavefront sensor, the alternative technique to check spherical optical components. We call this device Hartmannometer, and compare its features to those of Fizeau interferometer.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander N. Nikitin, Alexander N. Nikitin, Nikolay Baryshnikov, Nikolay Baryshnikov, Dmitrii Denisov, Dmitrii Denisov, Valerii Karasik, Valerii Karasik, Alexey Sakharov, Alexey Sakharov, Pavel Romanov, Pavel Romanov, Julia Sheldakova, Julia Sheldakova, Alexis Kudryashov, Alexis Kudryashov, } "Comparative analysis of methods and optical-electronic equipment to control the form parameters of spherical mirrors", Proc. SPIE 10539, Photonic Instrumentation Engineering V, 105390Z (22 February 2018); doi: 10.1117/12.2297078; https://doi.org/10.1117/12.2297078


A device based on the Shack Hartmann wave front sensor...
Proceedings of SPIE (March 15 2016)
Imaging Of The Wavefront Under Test In Interferometry
Proceedings of SPIE (November 19 1985)
Interferometric testing for large optical elements
Proceedings of SPIE (October 05 2000)
High-precision testing of optical components
Proceedings of SPIE (September 20 1998)
Advanced wavefront sensing and control testbed (AWCT)
Proceedings of SPIE (July 22 2010)

Back to Top