22 February 2018 Curved sensors for compact high-resolution wide-field designs: prototype demonstration and optical characterization
Author Affiliations +
Proceedings Volume 10539, Photonic Instrumentation Engineering V; 1053913 (2018) https://doi.org/10.1117/12.2291472
Event: SPIE OPTO, 2018, San Francisco, California, United States
Abstract
Over the recent years, a huge interest has grown for curved electronics, particularly for opto-electronics systems. Curved sensors help the correction of off-axis aberrations, such as Petzval Field Curvature, astigmatism, and bring significant optical and size benefits for imaging systems. In this paper, we first describe advantages of curved sensor and associated packaging process applied on a 1/1.8’’ format 1.3Mpx global shutter CMOS sensor (Teledyne EV76C560) into its standard ceramic package with a spherical radius of curvature Rc=65mm and 55mm. The mechanical limits of the die are discussed (Finite Element Modelling and experimental), and electro-optical performances are investigated. Then, based on the monocentric optical architecture, we proposed a new design, compact and with a high resolution, developed specifically for a curved image sensor including optical optimization, tolerances, assembly and optical tests. Finally, a functional prototype is presented through a benchmark approach and compared to an existing standard optical system with same performances and a x2.5 reduction of length. The finality of this work was a functional prototype demonstration on the CEA-LETI during Photonics West 2018 conference. All these experiments and optical results demonstrate the feasibility and high performances of systems with curved sensors.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bertrand Chambion, Christophe Gaschet, Thibault Behaghel, Aurélie Vandeneynde, Stéphane Caplet, Stéphane Gétin, David Henry, Emmanuel Hugot, Wilfried Jahn, Simona Lombardo, Marc Ferrari, "Curved sensors for compact high-resolution wide-field designs: prototype demonstration and optical characterization", Proc. SPIE 10539, Photonic Instrumentation Engineering V, 1053913 (22 February 2018); doi: 10.1117/12.2291472; https://doi.org/10.1117/12.2291472
PROCEEDINGS
10 PAGES + PRESENTATION

SHARE
RELATED CONTENT

Near ultraviolet spectrograph for balloon platform
Proceedings of SPIE (June 15 2015)
Optical Design With A Pocket Calculator
Proceedings of SPIE (June 30 1982)
High-resolution IC inspection technique
Proceedings of SPIE (June 05 2001)

Back to Top