Scattering scanning near field optical microscopy (s-SNOM) is a useful tool for providing optical resolution well below the diffraction limit with chemical selectivity. s-SNOM relies on recording the scattering light of a scanning probe tip, coupling the near-field interaction to a far field photo-detector. Photo-induced force microscopy (PiFM) is a much newer technique that also provides chemical resolution well below the diffraction limit. In PiFM, the signal arises from measuring the light induced force on a scanning probe tip of a sample interacting with laser light. It measures and records all information in the near field, with no need for a photo-detector. In this presentation, we describe results comparing and contrasting s-SNOM and PiFM displaying the strengths and weaknesses of both methods.