27 February 2018 PiFM vs s-SNOM: a comparative study
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Proceedings Volume 10549, Complex Light and Optical Forces XII; 105491L (2018) https://doi.org/10.1117/12.2319340
Event: SPIE OPTO, 2018, San Francisco, California, United States
Scattering scanning near field optical microscopy (s-SNOM) is a useful tool for providing optical resolution well below the diffraction limit with chemical selectivity. s-SNOM relies on recording the scattering light of a scanning probe tip, coupling the near-field interaction to a far field photo-detector. Photo-induced force microscopy (PiFM) is a much newer technique that also provides chemical resolution well below the diffraction limit. In PiFM, the signal arises from measuring the light induced force on a scanning probe tip of a sample interacting with laser light. It measures and records all information in the near field, with no need for a photo-detector. In this presentation, we describe results comparing and contrasting s-SNOM and PiFM displaying the strengths and weaknesses of both methods.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ryan M. Khan, Ryan M. Khan, Bongsu Kim, Bongsu Kim, Eric O. Potma, Eric O. Potma, } "PiFM vs s-SNOM: a comparative study", Proc. SPIE 10549, Complex Light and Optical Forces XII, 105491L (27 February 2018); doi: 10.1117/12.2319340; https://doi.org/10.1117/12.2319340

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