15 August 1989 Surface Plasmons As Interfacial Light For The Characterization Of Thin Films
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Proceedings Volume 1056, Photochemistry in Thin Films; (1989) https://doi.org/10.1117/12.951615
Event: OE/LASE '89, 1989, Los Angeles, CA, United States
Abstract
This paper deals with the application of plasmon surface polaritions (PSP) for the characterization of thin films, e.g. Langmuir-Blodgett multilayer assemblies. Examples are given for total internal diffraction of PSP by dielectric phase gratings, interferometry at an index step and, finally, recent developments in the new field of PSP imaging and microscopy are presented.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wolfgang Knoll, Benno Rothenhausler, Werner Hickel, "Surface Plasmons As Interfacial Light For The Characterization Of Thin Films", Proc. SPIE 1056, Photochemistry in Thin Films, (15 August 1989); doi: 10.1117/12.951615; https://doi.org/10.1117/12.951615
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