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13 April 2018 Wide angle astrometric demonstration on the micro-arcsecond metrology testbed
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Proceedings Volume 10568, International Conference on Space Optics — ICSO 2004; 105682P (2018)
Event: International Conference on Space Optics 2004, 2004, Toulouse, France
The Space Interferometry Mission (SIM) requires fringe measurements to the level of picometers in order to produce astrometric data at the micro-arc-second level. To be more specific, it is necessary to measure both the position of the starlight central fringe and the change in the internal optical path of the interferometer to a few hundreds of picometers. The internal path is measured with a small heterodyne metrology beam, whereas the starlight fringe position is estimated with a CCD sampling a large concentric annular beam. One major challenge for SIM is to align the metrology beam with the starlight beam to keep the consistency between these two sensors at the system level while articulating the instrument optics over the field of view. The Micro-Arcsecond Metrology testbed (MAM) developed at the Jet Propulsion Laboratory, California Institute of Technology, features an optical interferometer with a white light source, all major optical components of a stellar interferometer and heterodyne metrology sensors. The setup is installed inside a large vacuum chamber in order to mitigate the atmospheric and thermal disturbances. Wide angle astrometric observations are simulated by articulating the optics over the 15 degrees field of regard to generate multiple artificial stars. Recent data show agreement between the metrology and starlight paths to 350pm in the full wide angle field of view of SIM. This paper describes the MAM optical setup, the observation process, the current data and how the performance relates to SIM.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Renaud Goullioud, Tsae-Pyng J. Shen, and Joseph H. Catanzarite "Wide angle astrometric demonstration on the micro-arcsecond metrology testbed", Proc. SPIE 10568, International Conference on Space Optics — ICSO 2004, 105682P (13 April 2018);

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