EUV Patterning I
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EPE fundamentals and impact of EUV: Will traditional design-rule calculations work in the era of EUV?
Double patterning at NA 0.33 versus high-NA single exposure in EUV lithography: an imaging comparison
Illumination source optimization in EUV lithography for staggered contact holes and pillars for DRAM applications
Aerial image based metrology of EUV masks: recent achievements, status, and outlook for the AIMS EUV platform
High-power LPP-EUV source with long collector mirror lifetime for high volume semiconductor manufacturing
Modeling of emission of particle debris from ablation of the tin target for the laser produced plasma extreme ultra-violet light source (Conference Presentation)
Effects of chamber conditions on EUV source efficiency and optical system performance during high-frequency operation