28 March 2018 Advanced CD-SEM imaging methodology for EPE measurements
Author Affiliations +
Abstract
Accurate EPE (edge placement error) characterization is important for the process control of high-volume manufacturing at N5 BEOL and beyond. In a CD-SEM metrology, the accurate edge-to-edge measurements among multiple layers and/or SEM-Contour extraction are required for the accurate EPE characterization. One of the technical challenges in CD-SEM metrology is to control charging effects caused by EB-irradiation during SEM image acquisition. In this paper, the effects of new charge control methods (Special Scan and Faster Scan), which are implemented in the latest Hitachi CD-SEM (CG6300), were examined with EUV resist hole-patterns. It was confirmed that Special Scan showed a profound effect on the suppression of the charge-induced errors. We also demonstrated the effects of the Special Scan for CD measurements and Contour Extraction for the EPE characterization of block on SAQP (SAQP lines + EUV block) pattern at imec iN7platform. Consequently, Special Scan is expected to be the solution for the accurate EPE measurements by CD-SEM.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yoshikata Takemasa, Takeyoshi Ohashi, Hiroyuki Shindo, Gian Lorusso, Anne-Laure Charley, "Advanced CD-SEM imaging methodology for EPE measurements", Proc. SPIE 10585, Metrology, Inspection, and Process Control for Microlithography XXXII, 1058522 (28 March 2018); doi: 10.1117/12.2298393; https://doi.org/10.1117/12.2298393
PROCEEDINGS
10 PAGES


SHARE
Back to Top