20 March 2018 Pin routability and pin access analysis on standard cells for layout optimization
Author Affiliations +
At advanced process nodes, especially at sub-28nm technology, pin accessibility and routability of standard cells has become one of the most challenging design issues due to the limited router tracks and the increased pin density. If this issue can’t be found and resolved during the cell design stage, the pin access problem will be very difficult to be fixed in implementation stage and will make the low efficiency for routing.

In this paper, we will introduce a holistic approach for the pin accessibility scoring and routability analysis. For accessibility, the systematic calculator which assigns score for each pin will search the available access points, consider the surrounded router layers, basic design rule and allowed via geometry. Based on the score, the “bad” pins can be found and modified. On pin routability analysis, critical pin points (placing via on this point would lead to failed via insertion) will be searched out for either layout optimization guide or set as OBS for via insertion blocking. By using this pin routability and pin access analysis flow, we are able to improve the library quality and performance.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jian Chen, Jian Chen, Jun Wang, Jun Wang, ChengYu Zhu, ChengYu Zhu, Wei Xu, Wei Xu, Shuai Li, Shuai Li, Eason Lin, Eason Lin, Odie Ou, Odie Ou, Ya-Chieh Lai, Ya-Chieh Lai, Shengrui Qu, Shengrui Qu, "Pin routability and pin access analysis on standard cells for layout optimization", Proc. SPIE 10588, Design-Process-Technology Co-optimization for Manufacturability XII, 105880D (20 March 2018); doi: 10.1117/12.2297290; https://doi.org/10.1117/12.2297290


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