In mask synthesis flows, during the correction step, an SRAF print avoidance (SPA) algorithm is relying on detection of printing predicted by model based simulation. In this paper we are presenting a cross-MEEF based SPA approach that offers elimination of SRAF printing while minimizing impact on process window. |
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SRAF
Printing
Photovoltaics
Optical proximity correction
Photomasks
Model-based design
Detection and tracking algorithms