27 November 2017 Tolerancing methods and metrics for imaging spectrometers
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Proceedings Volume 10590, International Optical Design Conference 2017; 105900Q (2017) https://doi.org/10.1117/12.2293155
Event: International Optical Design Conference - IODC 2017, 2017, Denver, United States
Abstract
We outline a method to tolerance imaging spectrometers using the cross-track, along-track, and spectral response functions of the system. This method offers a direct comparison of the expected performance relative to a standard set of metrics.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lori B. Moore, Pantazis Mouroulis, "Tolerancing methods and metrics for imaging spectrometers", Proc. SPIE 10590, International Optical Design Conference 2017, 105900Q (27 November 2017); doi: 10.1117/12.2293155; https://doi.org/10.1117/12.2293155
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