27 November 2017 Tolerancing methods and metrics for imaging spectrometers
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Proceedings Volume 10590, International Optical Design Conference 2017; 105900Q (2017) https://doi.org/10.1117/12.2293155
Event: International Optical Design Conference - IODC 2017, 2017, Denver, United States
Abstract
We outline a method to tolerance imaging spectrometers using the cross-track, along-track, and spectral response functions of the system. This method offers a direct comparison of the expected performance relative to a standard set of metrics.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lori B. Moore, Lori B. Moore, Pantazis Mouroulis, Pantazis Mouroulis, } "Tolerancing methods and metrics for imaging spectrometers", Proc. SPIE 10590, International Optical Design Conference 2017, 105900Q (27 November 2017); doi: 10.1117/12.2293155; https://doi.org/10.1117/12.2293155
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