10 April 2018 Real-time in-chip phase noise characterization of digitally controlled swept laser source
Author Affiliations +
Abstract
Distributed optical fiber sensors are increasingly utilized method of distributed strain and temperature sensing, and the swept laser source plays an significant role in these applications. However, there is dynamic frequency-noise as the laser sweeping. In this paper, we proposed and experimentally demonstrated a real-time in-situ phase noise detecting method in a field programmable gate array (FPGA) chip, which permits accurate and insightful investigation of laser stability. This method takes only 1 clock cycle to capture the phase noise.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zheyi Yao, Zhen Chen, Gerald Hefferman, Tao Wei, "Real-time in-chip phase noise characterization of digitally controlled swept laser source", Proc. SPIE 10598, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2018, 105982M (10 April 2018); doi: 10.1117/12.2295858; https://doi.org/10.1117/12.2295858
PROCEEDINGS
4 PAGES + PRESENTATION

SHARE
RELATED CONTENT

Development of low noise CCD readout front-end
Proceedings of SPIE (September 11 2015)
Study on signal simulator for photon counting laser ranging
Proceedings of SPIE (November 05 2015)
Digital cooled InSb detector for IR detection
Proceedings of SPIE (October 10 2003)
A simple all-digital PET system
Proceedings of SPIE (March 15 2007)

Back to Top