Paper
29 August 1977 The Curved Crystal X-Ray Spectrometer For The HEAO-B Satellite
C. R. Canizares, G. W. Clark, D. Bardas, T. Markert
Author Affiliations +
Proceedings Volume 0106, X-Ray Imaging; (1977) https://doi.org/10.1117/12.955467
Event: 1977 SPIE/SPSE Technical Symposium East, 1977, Reston, United States
Abstract
The Focal Plane Crystal Spectrometer on HEAO-B is a moderate to high resolution, curved-crystal, Bragg spectrometer which operates behind a grazing incidence x-ray telescope. It is designed to allow detailed spectral studies of both point and extended celestial x-ray sources in the energy range 0.2-3.3 keV, with resolutions of 50 to 1000. The analyzing elements are six torroidal diffractors, and the detectors are position-sensitive, flow, proportional counters. HEAO-B is scheduled for launch in June, 1978.
© (1977) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. R. Canizares, G. W. Clark, D. Bardas, and T. Markert "The Curved Crystal X-Ray Spectrometer For The HEAO-B Satellite", Proc. SPIE 0106, X-Ray Imaging, (29 August 1977); https://doi.org/10.1117/12.955467
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Cited by 9 scholarly publications.
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KEYWORDS
Crystals

Sensors

Spectroscopy

X-rays

Spectral resolution

X-ray telescopes

Telescopes

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