1 December 2017 Microscale localization and isolation of light emitting imperfections in monocrystalline silicon solar cells
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Proceedings Volume 10603, Photonics, Devices, and Systems VII; 1060316 (2017) https://doi.org/10.1117/12.2292711
Event: Photonics Prague 2017, 2017, Prague, Czech Republic
Abstract
An imperfections or defects may appear in fabricated monocrystalline solar cells. These microstructural imperfections could have impact on the parameters of whole solar cell. The research is divided into two parts, firstly, the detection and localization defects by using several techniques including current-voltage measurement, scanning probe microscopy (SPM), scanning electron microscope (SEM) and electroluminescence. Secondly, the defects isolation by a focused ion beam (FIB) milling and impact of a milling process on solar cells. The defect detection is realized by I-V measurement under reverse biased sample. For purpose of localization, advantage of the fact that defects or imperfections in silicon solar cells emit the visible and near infrared electroluminescence under reverse biased voltage is taken, and CCD camera measurement for macroscopic localization of these spots is applied. After rough macroscopic localization, microscopic localization by scanning probe microscopy combined with a photomultiplier (shadow mapping) is performed. Defect isolation is performed by a SEM equipped with the FIB instrument. FIB uses a beam of gallium ions which modifies crystal structure of a material and may affect parameters of solar cell. As a result, it is interesting that current in reverse biased sample with isolated defect is smaller approximately by 2 orders than current before isolation process.
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Adam Gajdoš, Adam Gajdoš, Lubomír Škvarenina, Lubomír Škvarenina, Pavel Škarvada, Pavel Škarvada, Robert Macků, Robert Macků, } "Microscale localization and isolation of light emitting imperfections in monocrystalline silicon solar cells", Proc. SPIE 10603, Photonics, Devices, and Systems VII, 1060316 (1 December 2017); doi: 10.1117/12.2292711; https://doi.org/10.1117/12.2292711
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