Paper
15 November 2017 Analysis on detection accuracy of binocular photoelectric instrument optical axis parallelism digital calibration instrument
Jia-ju Ying, Jian-ling Yin, Dong-sheng Wu, Jie Liu, Yu-dan Chen
Author Affiliations +
Proceedings Volume 10605, LIDAR Imaging Detection and Target Recognition 2017; 106053A (2017) https://doi.org/10.1117/12.2295575
Event: LIDAR Imaging Detection and Target Recognition 2017, 2017, Changchun, China
Abstract
Low-light level night vision device and thermal infrared imaging binocular photoelectric instrument are used widely. The maladjustment of binocular instrument ocular axises parallelism will cause the observer the symptom such as dizziness, nausea, when use for a long time. Binocular photoelectric equipment digital calibration instrument is developed for detecting ocular axises parallelism. And the quantitative value of optical axis deviation can be quantitatively measured. As a testing instrument, the precision must be much higher than the standard of test instrument. Analyzes the factors that influence the accuracy of detection. Factors exist in each testing process link which affect the precision of the detecting instrument. They can be divided into two categories, one category is factors which directly affect the position of reticle image, the other category is factors which affect the calculation the center of reticle image. And the Synthesize error is calculated out. And further distribute the errors reasonably to ensure the accuracy of calibration instruments.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jia-ju Ying, Jian-ling Yin, Dong-sheng Wu, Jie Liu, and Yu-dan Chen "Analysis on detection accuracy of binocular photoelectric instrument optical axis parallelism digital calibration instrument", Proc. SPIE 10605, LIDAR Imaging Detection and Target Recognition 2017, 106053A (15 November 2017); https://doi.org/10.1117/12.2295575
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KEYWORDS
Reticles

Calibration

Charge-coupled devices

Error analysis

Image processing

Infrared imaging

Prototyping

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