Logarithmic profile mapping multi-scale Retinex for restoration of low illumination images

Haiyan Shi; Ngaiming Kwok; Hongkun Wu; Ruowei Li; Shilong Liu; Ching-Feng Lin; Chin Yeow Wong

doi:10.1117/12.2302669

10 April 2018 Logarithmic profile mapping multi-scale Retinex for restoration of low illumination images

Haiyan Shi, Ngaiming Kwok, Hongkun Wu, Ruowei Li, Shilong Liu, Ching-Feng Lin, Chin Yeow Wong

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Proceedings Volume 10615, Ninth International Conference on Graphic and Image Processing (ICGIP 2017); 106152H (2018) https://doi.org/10.1117/12.2302669
Event: Ninth International Conference on Graphic and Image Processing, 2017, Qingdao, China

Abstract

Images are valuable information sources for many scientific and engineering applications. However, images captured in poor illumination conditions would have a large portion of dark regions that could heavily degrade the image quality. In order to improve the quality of such images, a restoration algorithm is developed here that transforms the low input brightness to a higher value using a modified Multi-Scale Retinex approach. The algorithm is further improved by a entropy based weighting with the input and the processed results to refine the necessary amplification at regions of low brightness. Moreover, fine details in the image are preserved by applying the Retinex principles to extract and then re-insert object edges to obtain an enhanced image. Results from experiments using low and normal illumination images have shown satisfactory performances with regard to the improvement in information contents and the mitigation of viewing artifacts.

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Haiyan Shi, Haiyan Shi, Ngaiming Kwok, Ngaiming Kwok, Hongkun Wu, Hongkun Wu, Ruowei Li, Ruowei Li, Shilong Liu, Shilong Liu, Ching-Feng Lin, Ching-Feng Lin, Chin Yeow Wong, Chin Yeow Wong, } "Logarithmic profile mapping multi-scale Retinex for restoration of low illumination images", Proc. SPIE 10615, Ninth International Conference on Graphic and Image Processing (ICGIP 2017), 106152H (10 April 2018); doi: 10.1117/12.2302669; https://doi.org/10.1117/12.2302669

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