12 January 2018 Front Matter: Volume 10616
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 10616, including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in 2017 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, edited by Yongtian Wang, Baohua Jia, Kimio Tatsuno, Proceedings of SPIE Vol. 10616 (SPIE, Bellingham, WA, 2018) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510617438

ISBN: 9781510617445 (electronic)

Published by

SPIE

P.O. Box 10, Bellingham, Washington 98227-0010 USA

Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445

SPIE.org

Copyright © 2018, Society of Photo-Optical Instrumentation Engineers.

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/18/$18.00.

Printed in the United States of America.

Publication of record for individual papers is online in the SPIE Digital Library.

00007_PSISDG10616_1061601_page_2_1.jpg

Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Aalipour, Rasoul, 0G

Bai, Shao-jun, 0A

Cai, Weijun, 0C

Cai, Zhijian, 0Z, 16

Cen, Zhaofeng, 08, 0H, 0U

Chang, Jun, 1H, 1J

Chen, Junzhang, 1E

Chen, Xi, 0W

Chen, Xinrong, 0Z

Chen, Zaiqing, 04

Chen, Zonghui, 1D

Cheng, HuaQi, 0I

Cui, Haitian, 1G

Cui, Jianguo, 0Y

Cui, Xutai, 0S

Cui, Yao, 1K

Ding, Lin, 0A

Dong, Liquan, 0W

Du, Baolin, 1L, 1M

Esmaeilie, Shahram, 0G

Fan, Guihua, 0X

Fan, Junjie, 0C

Feng, Chen, 1C

Feng, Li, 06

Fu, Yuegang, 0Q

Gong, Chen, 14

Gong, Hai, 0M

Gu, Wenhua, 09

Guo, Pan, 0F

Guo, Peiliang, 16

Guo, Xiaohu, 1I

Guo, YuLin, 13

Han, Shaokun, 0T

Hao, Hongliang, 1D

Hao, Qun, 0L

He, Jingsuo, 15

He, Wenjun, 0Q

He, Yong, 0O

Ho, Ho-pui, 10

Hou, LinBao, 0I

Hu, Leili, 1L, 1M

Hu, Tian-Tian, 19

Hu, Yao, 0L

Huang, Jianwei, 1K

Huang, Qingmei, 1C

Huang, Wei, 10

Huang, Xiao-li, 10

Huang, Xiaoqiao, 04

Jia, Wentao, 0Q

Jiang, Jinhu, 09

Jiang, Lian, 19

Jiang, Xu, 0B, 13

Kong, Lingqin, 1I

Lei, Jieyu, 0T

Li, Chaoming, 0Z

Li, Fuqiang, 0C

Li, Jing, 0U

Li, Lin, 11

Li, Na, 0C

Li, Tengfei, 0L

Li, Wei, 1C

Li, Xiaotong, 08, 0H, 0U

Li, Xing-ao, 10

Li, XingLong, 0I

Li, YingChun, 0D, 0V

Liang, Chao, 0Y

Liang, Jinhua, 14

Liang, Jiyuan, 1E

Liu, Bingguo, 0F

Liu, Changjiang, 1L, 1M

Liu, Danji, 17

Liu, Di, 0V

Liu, Guodong, 0F

Liu, Huina, 06

Liu, Liquan, 06

Liu, Ming, 0W

Liu, Quan, 16

Liu, Xiaohua, 0W

Liu, YuJiao, 0I

Liu, Yunfei, 14

Liu, Yunhe, 1E

Liu, Zhiying, 0Q

Liu, Zi-wei, 18

Long, Liang, 0P

Lu, Binghui, 0F

Lu, Jibing, 06

Lu, Tielin, 1I

Luo, Qiang, 0Y

Luo, Shi-kui, 0E

Luo, Ting-yun, 0E

Lv, Hongpeng, 0Y

Ma, Fenghua, 12

Ma, Hua, 0O

Ma, Jianshe, 03, 0J, 1K

Ma, Lan, 1D

Ma, Tao, 1A

Ma, Xiaohui, 12

Mao, Yi-feng, 0E

Ming, Hai, 12

Ni, Guoqiang, 0X

Nitta, K., 05

Niu, Yajun, 1H, 1J

Nomura, Takanori, 02

Pan, Feng, 1D

Pan, Zhipeng, 17

Pei, Jing-yang, 0A

Peng, Jing-xiao, 10

Peng, Zhong, 0S

Qian, Liyong, 1G

Qin, Qingwang, 06

Ren, Hai-pei, 0E

Ren, Huan, 0O

Shi, Jiao-hong, 0E

Shi, Junsheng, 04

Shi, Zhendong, 0O

Soloviev, Oleg, 0M

Song, Chun-yuan, 10

Song, Haiping, 1J

Song, Yuming, 0J

Song, Zhichao, 1E

Su, Bo, 15

Su, Junhong, 1F

Su, Ping, 03, 0J, 1K

Su, Yanfeng, 16

Sun, Huayan, 0X

Sun, Lei, 1C

Sun, Weiping, 0Y

Tai, Yonghan, 04

Tan, Ting, 0A

Tang, Lu, 0E

Tao, Bo, 0N

Tao, Yu, 0B, 13

Timofeev, Alexander N., 0T

Vdovin, Gleb, 0M

Verhaegen, Michel, 0M

Wang, An-su, 18

Wang, Anting, 12

Wang, Chaofeng, 1C

Wang, Fupeng, 1I

Wang, Guixia, 1F

Wang, Huarui, 1B

Wang, Ke, 1E

Wang, Qianqian, 0S

Wang, RunFeng, 0D

Wang, Xinwei, 0R

Wang, Yuan, 07

Wang, Yuanhang, 1G

Wang, Zhe, 0P

Wang, Zi, 12

Wu, Jianhong, 0Z, 16

Wu, Limin, 0P

Wu, Yaxiong, 15

Wu, Yuxiang, 17

Wu, Zhengjun, 08

Xia, Wenze, 0T

Xiao, Wen, 1D

Xie, Bin, 18

Xing, Yang-guang, 11

Xu, Haiping, 14

Xu, Junqi, 1F

Xu, Shuang, 0N

Xue, Bindang, 1E

Xue, Changxi, 0K

Yang, Biao, 0D, 0X

Yang, Hongfang, 0K

Yang, Jian, 0H

Yang, Tao, 10

Yang, Yan, 1B

Yang, Yi, 0O

Yao, Honghui, 0N

Yi, Rigui, 0W

Yin, Yujian, 03

Yu, Fei, 0A

Yu, Feihong, 07

Yu, Xun, 0B, 13

Yuan, Zengquan, 14

Yue, Huimin, 17

Yun, Lijun, 04

Zeng, Chun-Mei, 19

Zeng, HaiRui, 0D

Zhai, Yu, 0T

Zhang, Chao, 04

Zhang, Cong, 15

Zhang, Cunlin, 15

Zhang, Fengqin, 0C

Zhang, Hongfei, 15

Zhang, Jian, 06

Zhang, Jiao, 0B

Zhang, Jingshui, 1I

Zhang, Juan, 11

Zhang, Jun, 1A

Zhang, Ke, 1J

Zhang, Le, 0S

Zhang, Lin, 0O

Zhang, Lisha, 0P

Zhang, ShaoWei, 0I

Zhang, Shengbo, 15

Zhang, TingHua, 0D, 0X

Zhang, Wen, 1I

Zhang, Yunqiang, 1H

Zhao, Ji, 1I

Zhao, Xue-min, 0A

Zhao, Yu, 0S

Zhao, Yuejin, 0W

Zhao, Zhixiong, 1B

Zhong, Xin, 0R

Zhong, Yao, 0F

Zhou, Yan, 0R

Zhu, Gang, 1B

Zhu, Xiangbing, 1G

Zhu, Yong-yuan, 10

Zou, Wenlong, 0Z, 16

Symposium Committee

General Chairs

  • Tianchu Li, National Institute of Metrology (China)

  • H. Phillip Stahl, NASA Marshall Space Flight Center (United States)

Conference Co-Chairs

  • Songlin Zhuang, Shanghai University of Science and Technology (China)

  • Liwei Zhou, Beijing Institute of Technology (China)

  • Shenghua Ye, Tianjin University (China)

  • Yimo Zhang, Tianjin University (China)

  • Zheng You, Tsinghua University (China)

  • Guangjun Zhang, Southeast University (China)

Technical Program Chair

  • Guofan Jin, Tsinghua University (China)

Technical Program Co-Chairs

  • Jinxue Wang, SPIE

  • Tiegen Liu, Tianjin University (China)

Local Organizing Committee Chair

  • Youhua Wu, China Instrument and Control Society (China)

Local Organizing Committee Co-Chairs

  • Guoqiang Ni, Beijing Institute of Technology (China)

  • Daoyin Yu, Tianjin University (China)

General Secretary

  • Tong Zhang, China Instrument and Control Society (China)

Administrative Vice General Secretary

  • Yu-nan Sun, Beijing Institute of Technology (China)

Vice General Secretaries

  • Qun Hao, Beijing Institute of Technology (China)

  • Yuejin Zhao, Beijing Institute of Technology (China)

  • Cunlin Zhang, Capital Normal University (China)

  • Liquan Dong, Beijing Institute of Technology (China)

Local Organizing Committee

  • Hongda Chen, Institute of Semiconductors, Chinese Academy of Sciences (China)

  • Xuping Zhang, Nanjing University (China)

  • Shangzhong Jin, China Jiliang University (China)

  • Libo Yuan, Harbin Engineering University (China)

  • Yumei Wen, Chongqing University (China)

  • Tian Lan, Beijing Institute of Technology (China)

  • Cuiling Li, Beijing Institute of Technology (China)

Conference Committee

Conference Chairs

  • Yongtian Wang, Beijing Institute of Technology (China)

  • Baohua Jia, Swinburne University of Technology (Australia)

  • Kimio Tatsuno, Koga Research Institute (Japan)

Program Committee

  • Yasuhiro Awatsuji, Kyoto Institute of Technology (Japan)

  • Jiabi Chen, University of Shanghai for Science and Technology (China)

  • Benjamin Eggleton, The University of Sydney (Australia)

  • Yi-chin Fang, National Kaohsiung First University of Science and Technology (Taiwan, China)

  • Qun Hao, Beijing Institute of Technology (China)

  • Hong Hua, The University of Arizona (United States)

  • Minghui Hong, National University of Singapore (Singapore)

  • Malgorzata Kujawińska, Warsaw University of Technology (Poland)

  • Irina Livshits, St. Petersburg State University of Information Technologies, Mechanics and Optics (Russian Federation)

  • Osamu Matoba, Kobe University (Japan)

  • David Moss, Swinburne University of Technology (Australia)

  • Gilles Pauliat, Institute of Optics (France)

  • Ann Roberts, University of Melbourne (Australia)

  • Guohai SiTu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)

  • Xiaodi Tan, Beijing Institute of Technology (China)

  • Theo T. Tschudi, Technische Universität Darmstadt (Germany)

  • Willi Ulrich, Carl Zeiss AG (Germany)

  • Paul Urbach, Delft University of Technology (Netherlands)

  • Masahiro Yamaguchi, Tokyo Institute of Technology (Japan)

  • Zexin Feng (Secretary), Beijing Institute of Technology (China)

Session Chairs

  • 1 Digital Holography

    Kimio Tatsuno, Koga Research Institute (Japan)

  • 2 Computational Imaging and Post-Processing

    Baohua Jia, Swinburne University of Technology (Australia)

  • 3 Opto-Mechanics and Instruments

    Yongtian Wang, Beijing Institute of Technology (China)

  • 4 Optical System Design

    Qun Hao, Beijing Institute of Technology (China)

  • 5 Optical Testing

    Xuemin Cheng, Tsinghua University (China)

Introduction

This year in Beijing, China, we held the sixth conference of Optical Systems and Modern Optoelectronic Instruments, which has been a sub-conference of OIT since its inauguration in 2008. In 2017, we selected 23 oral presentations from over 80 submissions to this sub-conference, including 8 invited talks. Experts from Japan, the Netherlands, the Islamic Republic of Iran and China attended the sub-conference in the Beijing International Conference Center, and presented their latest research findings. We also had an excellent attentive audience who provided many good questions and stimulated exchanges with the speakers.

There were five sessions in the sub-conference of Optical Systems and Modern Optoelectronic Instruments: Digital Holography (session 1), Computational Imaging and Post-Processing (session 2), Opto-Mechanics and Instruments (session 3), Optical System Design (session 4) and Optical Testing (session 5).

We believe that this year’s Optical Systems and Modern Optoelectronic Instruments conference maintained its previous high standards, and we hope that the papers included in the proceedings will prove valuable to our fellow scientists and engineers.

Yongtian Wang

Baohua Jia

Kimio Tatsuno

Conference Organizers

  • Organized by

  • Opto-Electronic-Mechanic Technology and System Integration Chapter, CIS (China)

  • Committee on Optoelectronic Technology, COS (China)

  • Committee on Optics, China Ordnance Society (China)

  • Optical Instrument Chapter, CIS (China)

  • Beijing Institute of Technology (China)

  • Tianjin University (China)

  • Tsinghua University (China)

  • Peking University (China)

  • Nanjing University (China)

  • Shanghai Jiao Tong University (China)

  • Zhejiang University (China)

  • Nankai University (China)

  • Capital Normal University (China)

  • Beijing University of Posts and Telecommunications (China)

  • Chongqing University (China)

  • University of Shanghai for Science and Technology (China)

  • Instrument Society of America (United States)

  • Institute of Measurement and Control (United Kingdom)

  • Hong Kong Institution of Engineers (Hong Kong, China)

  • The Society of Measurement and Control (Japan)

© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 10616", Proc. SPIE 10616, 2017 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 1061601 (12 January 2018); doi: 10.1117/12.2316663; https://doi.org/10.1117/12.2316663
PROCEEDINGS
16 PAGES


SHARE
Back to Top