10 January 2018 Initial research on the characterization methods of sparkle spots in optical thin films
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Abstract
In this article, we made a preliminary study on the main influencing factors of sparkle spots, put forward the concept of "sparklingness" to characterize the strength of sparkle spots, and proposed a standard measurement method for the sparklingness. We proposed to use 532 nm green laser pointer as the testing light source, let the light pass through the film and form a sparkle spots image at the receiving CCD or a piece of white paper. A standard image processing method was used to obtain an index number standing for the scattering status of the laser, which is defined as “sparklingness”. In the experiment, we also analyzed the power dependence of sparklingness. With proper calibration, the measurement error of the sparklingness can be minimized, and it can be used as a physical quantity to describe the film quality as of the sparkle issue. This work can be a useful reference for further study of the sparkle issue in optical films.
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Jinhu Jiang, Jinhu Jiang, Wenhua Gu, Wenhua Gu, } "Initial research on the characterization methods of sparkle spots in optical thin films", Proc. SPIE 10616, 2017 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 1061609 (10 January 2018); doi: 10.1117/12.2288052; https://doi.org/10.1117/12.2288052
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