12 January 2018 Front Matter: Volume 10620
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 10620, including the Title Page, Copyright information, Table of Contents, and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in 2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, edited by Guohai Situ, Xun Cao, Wolfgang Osten, Proceedings of SPIE Vol. 10620 (SPIE, Bellingham, WA, 2018) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510617513

ISBN: 9781510617520 (electronic)

Published by

SPIE

P.O. Box 10, Bellingham, Washington 98227-0010 USA

Telephone +1 360 676 3290 (Pacific Time) · Fax +1 360 647 1445

SPIE.org

Copyright © 2018, Society of Photo-Optical Instrumentation Engineers.

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/18/$18.00.

Printed in the United States of America.

Publication of record for individual papers is online in the SPIE Digital Library.

00047_PSISDG10620_1062001_page_2_1.jpg

Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

An, Ran, 0T

Bai, Xueqiong, 1L

Bi, Yanqiang, 10

Cai, Daonan, 0Z

Cai, Huai-yu, 0D

Cai, Yi, 0H, 0O

Cao, Fubin, 0S

Cao, Liangcai, 03

Cen, Zhaofeng, 0L

Chen, Defen, 0G

Chen, Ni, 11

Chen, Qian, 04

Chen, Qingguang, 19

Chen, Tianyi, 1K

Chen, Wen, 07

Chen, Xi, 0Y

Chen, Xiaodong, 18, 1D

Cheng, Feiyan, 0Q

Cheng, Haobo, 1L

Cheng, Zhen, 1E

Chi, Weining, 1S

Cui, Guangmang, 1O

Dai, Honglin, 0V

Deng, Chengyang, 1L

Deng, Zhiwei, 1A

Ding, Lin, 0I

Ding, Xiang, 1H

Dong, Liquan, 0U, 0W, 0Y, 0Z, 15

Dong, Xiao-tong, 0D

Fan, Songtao, 1J, 1M

Fu, Shihang, 1H

Fu, Yumei, 1K

Gao, Mei-Jing, 0F

Gong, Xiaoli, 1O

Guo, Yongcai, 1B

Guo, Yongxing, 0C

Han, Peng, 0B, 1P, 1R

Han, Shaokun, 13

Hao, Conghui, 0Y

Horisaki, Ryoichi, 02

Hou, Shuai, 0I

Hu, Yao, 1H

Hua, Weiping, 1O

Hua, Xiao, 0B

Huang, Can, 08

Huang, Gang, 0E, 0J

Huang, Hantao, 1J

Huang, Jing, 0N

Huang, Qingmei, 0G

Huang, Xiaoqiao, 0Q, 1A

Huang, Zhan-hua, 0D

Hui, Mei, 0U, 0W, 0Y, 15

Jia, Guorui, 10

Jian, Yabin, 06

Jiang, Chengyi, 1F

Jiang, Feng, 1T

Jiang, Junfeng, 08

Jiang, Peng, 16

Jiang, Wei, 1T

Jiang, Zhilong, 09, 0A

Jin, Guofan, 03

Ke, Jun, 14, 1Q

Kong, Lingqin, 0U, 0Y, 15

Kong, Yan, 09, 0A

Lei, Jieyu, 13

Lei, Pingshun, 1J, 1M

Li, Boxuan, 17

Li, Chao, 0I

Li, Dayan, 05

Li, Feiyan, 1A

Li, Ge, 0X

Li, Gongfa, 0C

Li, Guowei, 05

Li, Jiaji, 04

Li, Jiangtong, 0V

Li, Jie, 0S

Li, Mengxue, 1F

Li, Rongji, 15

Li, Wei, 0G

Li, Xiaohui, 15

Li, Xiaotong, 0L

Li, Xicai, 1A

Li, Xiyuan, 06

Li, Yasheng, 1L

Li, Yi, 0U

Li, Yinlong, 0E

Liang, Haitao, 18, 1D

Liao, Ningfang, 1L

Lin, Haojian, 0T

Lin, Zhe, 0E, 0J

Liu, Cheng, 09, 0A

Liu, Cheng, 0I

Liu, Dong, 1E

Liu, Fei, 09, 0A

Liu, Gang, 0T

Liu, Kun, 08

Liu, Likun, 1U

Liu, Lingling, 15

Liu, Mengnan, 1F

Liu, Ming, 0U, 0W, 0Y, 0Z, 15

Liu, Tiegen, 08

Liu, Tongtong, 1F

Liu, Wei, 0X

Liu, Xiaohua, 0W, 0Y, 0Z, 15

Liu, Yilin, 18, 1D

Liu, Yue, 0H, 0O

Liu, Yuliang, 1M

Liu, Yun, 1E

Liu, Zhengjun, 0K

Lu, Li, 1T

Lu, Yang, 0G

Luo, Jiasai, 1B

Luo, Kaiqing, 0B, 1P, 1R

Luo, Yongdao, 0V

Ma, Liang, 1I

Ma, Zhuang, 0L

Meng, Xin, 09

Nian, Hua, 0P

Ou, Quanhong, 0T

Pan, Yu, 1C

Panezai, Spozmai, 1N

Pang, Zongguang, 15

Pei, Yifei, 10

Peng, Li, 0B, 1P, 1R

Peng, Lijiang, 0W

Qi, Na, 1E

Qian, Shuai, 0R

Qian, Yunsheng, 1G

Qiu, Jian, 0B, 1P, 1R

Rong, Lu, 1N, 1S

Shang, Yonghong, 06, 10

Shen, Cheng, 0K

Shen, Huanbo, 19

Sheng, Wen, 1T

Shi, Junsheng, 0Q, 1A

Si, Lipeng, 0M

Situ, Guohai, 05, 11

Su, Haohang, 0N

Su, Xiu, 18, 1D

Sun, Aihui, 0A

Sun, Jiasong, 04

Sun, Li, 0P

Sun, Liang, 1J, 1M

Sun, Peng, 1F

Tam. Ai-Ling, 0F

Tan, Jiubin, 0K

Tao, Bo, 0C

Tao, Dongxing, 10

Tian, Xiaolin, 09

Tian, Xiaolin, 0A

Tong, Qinqin, 0B

Wan, Yong, 1F

Wang, Bin, 1I

Wang, Binqiang, 19

Wang, Dayong, 1N, 1S

Wang, Honghong, 1N

Wang, Jiabin, 0H, 0O

Wang, Jing, 06, 10

Wang, Jinjiang, 12, 1C

Wang, Jing-Yuan, 0F

Wang, Liang, 13

Wang, Pengfei, 12

Wang, Qing, 0M

Wang, Rui, 1P

Wang, Runze, 06

Wang, Shouyu, 09, 0A

Wang, Shuang, 08

Wang, Wenai, 0X

Wang, Xia, 0R

Wang, Xin, 1B

Wang, Xinwei, 1J, 1M

Wang, Yi, 18, 1D

Wang, Yilun, 1G

Wang, Yongtian, 0H, 0O

Wang, Yunxin, 1N, 1S

Wang, Zhun, 0Q

Wu, Hong, 0Y

Xia, Wenze, 13

Xiang, Shihan, 1K

Xiao, JiangWei, 1R

Xie, Zhihua, 16

Xiong, Jinquan, 16

Xiong, Zhiwei, 1E

Xu, Huaiyuan, 18, 1D

Xu, Jie, 0F

Xu, Shuang, 0C

Xue, Liang, 09, 0A

Yang, Huizhen, 11

Yang, Min, 0H

Yang, Ming, 0F

Yang, Weimei, 0T

Yang, Wenming, 1L

Yu, Fei, 0E, 0I

Yu, Wei, 09

Yu, Yanbo, 0P

Yuan, Yuanyuan, 1S

Zan, Xinwu, 1K

Zhai, Changchao, 1N

Zhai, Yu, 13

Zhang, Chao, 10

Zhang, Jialin, 04

Zhang, JingChuan, 06, 10

Zhang, Li, 1H

Zhang, Linxia, 14, 1Q

Zhang, Shuai, 16

Zhang, Wenhui, 03

Zhang, Wenwen, 17

Zhang, Xu, 1N

Zhang, Xuanyu, 1M

Zhang, Xuezhi, 08

Zhang, Yongning, 08

Zhao, Jie, 1S, 1N

Zhao, Jufeng, 1O

Zhao, Liting, 0E, 0J

Zhao, Lu, 0H, 0O

Zhao, Yuejin, 0U, 0W, 0Y, 0Z, 15

Zhao, Zhanping, 0P

Zhe, Lin, 0I

Zhou, Ao, 11

Zhou, Jingjing, 0R

Zhou, Qun, 14, 1Q

Zhou, Yan, 1J, 1M

Zhu, Lingling, 0S

Zhu, Liyao, 1O

Zhu, Meng, 0D

Zu, Zheng-Long, 0F

Zuo, Chao, 04

Symposium Committee

General Chairs

  • Tianchu Li, National Institute of Metrology (China)

  • H. Phillip Stahl, NASA Marshall Space Flight Center (United States)

Conference Co-Chairs

  • Songlin Zhuang, Shanghai University of Science and Technology (China)

  • Liwei Zhou, Beijing Institute of Technology (China)

  • Shenghua Ye, Tianjin University (China)

  • Yimo Zhang, Tianjin University (China)

  • Zheng You, Tsinghua University (China)

  • Guangjun Zhang, Southeast University (China)

Technical Program Chair

  • Guofan Jin, Tsinghua University (China)

Technical Program Co-Chairs

  • Jinxue Wang, SPIE

  • Tiegen Liu, Tianjin University (China)

Local Organizing Committee Chair

  • Youhua Wu, China Instrument and Control Society (China)

Local Organizing Committee Co-Chairs

  • Guoqiang Ni, Beijing Institute of Technology (China)

  • Daoyin Yu, Tianjin University (China)

General Secretary

  • Tong Zhang, China Instrument and Control Society (China)

Administrative Vice General Secretary

  • Yu-nan Sun, Beijing Institute of Technology (China)

Vice General Secretaries

  • Qun Hao, Beijing Institute of Technology (China)

  • Yuejin Zhao, Beijing Institute of Technology (China)

  • Cunlin Zhang, Capital Normal University (China)

  • Liquan Dong, Beijing Institute of Technology (China)

Local Organizing Committee

  • Hongda Chen, Institute of Semiconductors, CAS (China)

  • Xuping Zhang, Nanjing University (China)

  • Shangzhong Jin, China Jiliang University (China)

  • Libo Yuan, Harbin Engineering University (China)

  • Yumei Wen, Chongqing University (China)

  • Tian Lan, Beijing Institute of Technology (China)

  • Cuiling Li, Beijing Institute of Technology (China)

Conference Committee

Conference Chairs

  • Guohai Situ, Shanghai Institute of Optics and Fine Mechanics, CAS (China)

  • Xun Cao, Nanjing University (China)

  • Wolfgang Osten, Universität Stuttgart (Germany)

Program Committee

  • George Barbastathis, Masssachusetts Institute of Technology (United States)

  • David Brady, Duke University (United States)

  • Qionghai Dai, Tsinghua University (China)

  • Byoungho Lee, Seoul National University (Korea, Republic of)

  • Cheng Liu, Shanghai Institute of Optics and Fine Mechanics, CAS (China)

  • Takanori Nomura, Wakayama University (Japan)

  • John T. Sheridan, University College Dublin (Ireland)

  • Guangming Shi, Xidian University (China)

  • Lei Tian, Boston University (United States)

  • Feng Wu, University of Science and Technology of China (China)

  • Ping Yu, Missouri University (United States)

  • Jingyi Yu, Shanghai Technological University (China)

  • Jianlin Zhao, Northwestern Polytechnic University (China)

  • Ni Chen (Secretary), Shanghai Institute of Optics and Fine Mechanics, CAS (China)

Session Chairs

  • 1 Computational Imaging

    • Guohai Situ, Shanghai Institute of Optics and Fine Mechanics, CAS (China)

  • 2 Microscopy

    • Xun Cao, Nanjing University (China)

  • 3 Lithography and Related Techniques

    • Qing Wang, Northwestern Polytechnical University (China)

  • 4 Light Field

    • Jinli Suo, Tsinghua University (China)

  • 5 Remote Sensing

    • Wen Chen, Hong Kong Polytechnic University (Hong Kong, China)

Introduction

This volume contains the papers presented during The 2017 International Conference on Optical Instrument and Technology (OIT 2017) at the topical meeting Optoelectronic Imaging/Spectroscopy and Signal Processing Technology.

The focus of this meeting was especially directed to the advances in this field and related areas. The extended scope was honored by a great response to our call for papers. Scientists and engineers, in particular from China, offered more than 90 submitted abstracts. This enormous response demanded a strong review of the abstracts to select the best out of the overwhelming number of excellent submissions. The strong limitation of the number of papers which can be presented orally and discussed effectively during a one-and-a-half day meeting without holding parallel sessions was again an important orientation. The classification of all accepted presentations into the topical sessions was also very difficult and often required compromises. We hope that our decision will be accepted by the audience.

The editors would like to express their thanks to the international program committee for helping us to find a good solution to finalize the meeting. We would also like to thank all the authors who spent much time and effort in the preparation of their papers. Our appreciation would also go to Professor Yunan Sun and Mrs. Cuiling Li, and all the local staff from Beijing Institute of Technology (China). Without their help, it was not possible to make the meeting so successful.

Guohai Situ

Xun Cao

Wolfgang Osten

Conference Organizers

  • Organized by

  • Opto-Electronic-Mechanic Technology and System Integration Chapter, CIS (China)

  • Committee on Optoelectronic Technology, COS (China)

  • Committee on Optics, China Ordnance Society (China)

  • Optical Instrument Chapter, CIS (China)

  • Beijing Institute of Technology (China)

  • Tianjin University (China)

  • Tsinghua University (China)

  • Peking University (China)

  • Nanjing University (China)

  • Shanghai Jiao Tong University (China)

  • Zhejiang University (China)

  • Nankai University (China)

  • Capital Normal University (China)

  • Beijing University of Posts and Telecommunications (China)

  • Chongqing University (China)

  • University of Shanghai for Science and Technology (China)

  • Instrument Society of America (United States)

  • Institute of Measurement and Control (United Kingdom)

  • Hong Kong Institution of Engineers (Hong Kong, China)

  • The Society of Measurement and Control (Japan)

© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 10620", Proc. SPIE 10620, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, 1062001 (12 January 2018); doi: 10.1117/12.2316686; https://doi.org/10.1117/12.2316686
PROCEEDINGS
18 PAGES


SHARE
Back to Top