Influences of overlap index on Fourier ptychography imaging

Honghong Wang; Lu Rong; Dayong Wang; Xu Zhang; Changchao Zhai; Spozmai Panezai; Yunxin Wang; Jie Zhao

doi:10.1117/12.2295548

12 January 2018 Influences of overlap index on Fourier ptychography imaging

Honghong Wang, Lu Rong, Dayong Wang, Xu Zhang, Changchao Zhai, Spozmai Panezai, Yunxin Wang, Jie Zhao

Proceedings Volume 10620, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology; 106201N (2018) https://doi.org/10.1117/12.2295548
Event: International Conference on Optical Instruments and Technology 2017, 2017, Beijing, China

Abstract

Fourier ptychography is a new type of synthetic aperture imaging technique based on phase retrieval method which can improve microscopeic imaging performance beyond the diffraction limit of the employed optical components by illuminating the object with oblique waves of different incident angles where the field of view remains unchanged. illumination angle and the overlap rate of spectrum will have a certain impact on the quality of reconstruction. In this paper, we study the effects of illumination angle and spectral overlap rate on the image quality of Fourier ptychography. The simulation results show that increasing the illumination angle and spectral overlap can improve the resolution, but there is a threshold for the key parameters of spectral overlap rate. The convergence rate decreases when the overlap rate exceeds 70%, and the reconstruction process is more time-consuming due to the high overlap rate. However the results of proposed study shows that an overlap of 60% is the optimal choice to acquire a high-quality recovery with high speed.

Citation Download Citation

Honghong Wang, Lu Rong, Dayong Wang, Xu Zhang, Changchao Zhai, Spozmai Panezai, Yunxin Wang, and Jie Zhao "Influences of overlap index on Fourier ptychography imaging", Proc. SPIE 10620, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, 106201N (12 January 2018); https://doi.org/10.1117/12.2295548

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available