Development of distortion measurement system for large deployable antenna via photogrammetry in vacuum and cryogenic environment

Pengsong Zhang; Shanping Jiang; Linhua Yang; Bolun Zhang

doi:10.1117/12.2292995

12 January 2018 Development of distortion measurement system for large deployable antenna via photogrammetry in vacuum and cryogenic environment

Pengsong Zhang, Shanping Jiang, Linhua Yang, Bolun Zhang

Author Affiliations +

Proceedings Volume 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 106210D (2018) https://doi.org/10.1117/12.2292995
Event: International Conference on Optical Instruments and Technology 2017, 2017, Beijing, China

Abstract

In order to meet the requirement of high precision thermal distortion measurement foraΦ4.2m deployable mesh antenna of satellite in vacuum and cryogenic environment, based on Digital Close-range Photogrammetry and Space Environment Test Technology of Spacecraft, a large scale antenna distortion measurement system under vacuum and cryogenic environment is developed in this paper. The antenna Distortion measurement system (ADMS) is the first domestic independently developed thermal distortion measurement system for large antenna, which has successfully solved non-contact high precision distortion measurement problem in large spacecraft structure under vacuum and cryogenic environment. The measurement accuracy of ADMS is better than 50 μm/5m, which has reached international advanced level. The experimental results show that the measurement system has great advantages in large structural measurement of spacecrafts, and also has broad application prospects in space or other related fields.

Citation Download Citation

Pengsong Zhang, Shanping Jiang, Linhua Yang, and Bolun Zhang "Development of distortion measurement system for large deployable antenna via photogrammetry in vacuum and cryogenic environment", Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210D (12 January 2018); https://doi.org/10.1117/12.2292995

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