12 January 2018 Layer-number dependent reflection spectra of WS2 and WSe2 flakes on SiO2/Si substrate
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Abstract
Tremendous interest has recently focused on the layered TMDs. Layer number is one of the fundamental parameters in TMDs. In this paper, layer-number dependent reflectivity of WS2 and WSe2 flakes on SiO2/Si substrate were measured by a simple and fast reflection spectrum probing technique. Characteristic excitonic peaks, A and B, and some higher energy density of states excitonic peaks were observed and their properties as a function of layer number were studied. Our results are in agreement with the previous reports.
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Xiaoli Li, Xiaoli Li, Xiaofen Qiao, Xiaofen Qiao, Longlong Wang, Longlong Wang, Yafang Shi, Yafang Shi, Weifeng Zhang, Weifeng Zhang, } "Layer-number dependent reflection spectra of WS2 and WSe2 flakes on SiO2/Si substrate", Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210J (12 January 2018); doi: 10.1117/12.2295111; https://doi.org/10.1117/12.2295111
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