Accurate measuring temperature by infrared thermal imaging system in vacuum and cryogenic environment

Yonghong Shang; Dongxing Tao; Yaqing Hou; Jing Wang; Yifei Pei

doi:10.1117/12.2293247

12 January 2018 Accurate measuring temperature by infrared thermal imaging system in vacuum and cryogenic environment

Yonghong Shang, Dongxing Tao, Yaqing Hou, Jing Wang, Yifei Pei

Proceedings Volume 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 106210L (2018) https://doi.org/10.1117/12.2293247
Event: International Conference on Optical Instruments and Technology 2017, 2017, Beijing, China

Abstract

Infrared thermal imaging technology uses the detector to receive infrared radiation from the measured object, and the object temperature distribution will be changed into a visual image by signal processing system. The accuracy of measuring temperature will be affected by the surface emission rate, reflectivity, atmospheric attenuation, and background radiation and environmental effect under normal temperature and pressure conditions. In order to realize the accurate temperature measurement under the condition of ultra-high vacuum and cryogenic environment, the general formula of the theoretic temperature of measured object surface is deduced, which based on the principle of thermal radiation and temperature measurement by infrared thermal imager. In this paper, the impact factors of temperature measurement accuracy of long-wave infrared thermal imaging system under those conditions are analyzed, and various theoretical numerical value of factors are plotted on the curve of precious accuracy temperature measurement. The results of analysis for the thermal imaging system will improve temperature measurement precision in vacuum thermal test, which have active practical significance.

Citation Download Citation

Yonghong Shang, Dongxing Tao, Yaqing Hou, Jing Wang, and Yifei Pei "Accurate measuring temperature by infrared thermal imaging system in vacuum and cryogenic environment", Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210L (12 January 2018); https://doi.org/10.1117/12.2293247

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