12 January 2018 Dielectric and metal target identification based on polarized light scattering analysis: a numerical study
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Abstract
In order to quantitatively analyze scattering from two dimensional randomly rough Gaussian surfaces, Kirchhoff approximation method is adopted in numerical calculation for analyzing full angular Stokes vectors of light scattering. With studying both the p- and s-polarized scattering fields from various materials such as metals and dielectrics, it is found that V components of scattering light from metals and dielectrics are different. Via analytical calculation according to slope probability density, the V component difference is attributed to refractive index of materials. Both numerical and analytical calculations prove the V component difference in light scattering can act as a criterion for metal and dielectric identification.
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Zhen-Gang Yan, Zhen-Gang Yan, Weiping Sun, Weiping Sun, Meng Ren, Meng Ren, Hongpeng Lv, Hongpeng Lv, Jie Li, Jie Li, Liang Xue, Liang Xue, Keding Yan, Keding Yan, Shouyu Wang, Shouyu Wang, } "Dielectric and metal target identification based on polarized light scattering analysis: a numerical study", Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 1062117 (12 January 2018); doi: 10.1117/12.2292521; https://doi.org/10.1117/12.2292521
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