12 January 2018 Front Matter: Volume 10622
This PDF file contains the front matter associated with SPIE Proceedings Volume 10622, including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in 2017 International Conference on Optical Instruments and Technology: Micro/Nano Photonics: Materials and Devices, edited by Baojun Li, Xingjun Wang, Ya Sha Yi, Proceedings of SPIE Vol. 10622 (SPIE, Bellingham, WA, 2018) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510617551

ISBN: 9781510617568 (electronic)

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.


Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

  • Agarwal, Anu M., 04

  • Bo, Yu Ming, 0C

  • Chen, Qian, 0D, 0F

  • Chen, Xiangfei, 0I

  • Chen, Xiangning, 0D, 0F

  • Chen, Xin, 0M

  • Chen, Xinrong, 0J

  • Chen, Yanjun, 0G

  • Cheng, Chang, 02

  • Cheng, Yushui, 0J

  • Dai, Daoxin, 03, 0K

  • Eric, Deborah, 09, 0A

  • Gao, Dongwen, 07

  • Guo, Jingshu, 0K

  • Guo, Yuhao, 04

  • Guo, Zhe, 0G

  • Han, Xiaowei, 07

  • Han, Zhaohong, 04

  • He, Bo, 0E

  • He, Jingsuo, 0H

  • He, Yumeng, 0N

  • Hu, Zuyuan, 0J

  • Huang, Qingzhong, 0D, 0F

  • Imran, Ali, 09, 0A

  • Jiang, Jianliang, 09, 0A

  • Jiang, Wei, 0D, 0F

  • Jin, Xipeng, 0H

  • Kimerling, Lionel C., 04

  • Lang, Yaopu, 08

  • Lei, Hongxiang, 06

  • Li, Baojun, 02, 06, 0B

  • Li, Chaoming, 0J

  • Li, Guifang, 04

  • Li, Juan, 06

  • Li, Lianyan, 0I

  • Li, Shufeng, 07

  • Li, Weile, 0E

  • Li, Yanqiu, 0G

  • Li, Yonghua, 0L

  • Liu, Chao, 08

  • Liu, Erhu, 03

  • Liu, Ke, 0G

  • Liu, Lihui, 0G

  • Liu, Qinggang, 08

  • Ma, Xiaoxue, 0M

  • Michel, Jurgen, 04

  • Ming, Xianshun, 05

  • Ni, Guoqiang, 0E

  • Nie, Hongrui, 0M

  • Padilla, Willie J., 05

  • Pan, Yong, 07

  • Qin, Zirui, 08

  • Ren, Kun, 0N

  • Ren, Xiaobin, 0N

  • Shan, Haifeng, 0K

  • Shao, Yue, 0F

  • Shi, Yuechun, 0I

  • Shi, Zexia, 0H

  • Song, Yong, 0E

  • Su, Bo, 0H

  • Sun, Liqun, 05

  • Sun, Xueming, 0H

  • Tan, Ying, 03

  • Tang, Yu, 0J

  • Wang, Haowei, 0E

  • Wang, Jing, 04

  • Wang, Jun, 0C

  • Wang, Li, 07

  • Wang, Rui, 0J

  • Wang, Ruike, 0H

  • Wang, Ying, 0D, 0F

  • Wu, Jianhong, 0J

  • Xu, Haiyan, 0J

  • Xu, Junfeng, 0E

  • Yang, Daquan, 0M

  • Yang, Huaidong, 05

  • Yang, Shengyi, 0E

  • Yang, Xianguang, 02, 0B

  • Yousaf, Muhammad, 09, 0A

  • Yu, Jian, 0J

  • Yu, Yue Chen, 0C

  • Yue, Chong, 08

  • Zhang, Cunlin, 0H

  • Zhang, Lin, 04

  • Zhang, Shengbo, 0H

  • Zhang, Weina, 06

  • Zhang, Yunshan, 0I

  • Zhao, Guozhong, 0L

  • Zhou, Xin, 0D, 0F

  • Proc. of SPIE Vol. 10622 1062201-6

Symposium Committee

General Chairs

  • Tianchu Li, National Institute of Metrology (China)

  • H. Phillip Stahl, NASA Marshall Space Flight Center (United States)

Conference Co-Chairs

  • Songlin Zhuang, Shanghai University of Science and Technology (China)

  • Liwei Zhou, Beijing Institute of Technology (China)

  • Shenghua Ye, Tianjin University (China)

  • Yimo Zhang, Tianjin University (China)

  • Zheng You, Tsinghua University (China)

  • Guangjun Zhang, Southeast University (China)

Technical Program Chair

  • Guofan Jin, Tsinghua University (China)

Technical Program Co-Chairs

  • Jinxue Wang, SPIE

  • Tiegen Liu, Tianjin University (China)

Local Organizing Committee Chair

  • Youhua Wu, China Instrument and Control Society (China)

Local Organizing Committee Co-Chairs

  • Guoqiang Ni, Beijing Institute of Technology (China)

  • Daoyin Yu, Tianjin University (China)

General Secretary

  • Tong Zhang, China Instrument and Control Society (China)

Administrative Vice General Secretary

  • Yu-nan Sun, Beijing Institute of Technology (China)

Vice General Secretaries

  • Qun Hao, Beijing Institute of Technology (China)

  • Yuejin Zhao, Beijing Institute of Technology (China)

  • Cunlin Zhang, Capital Normal University (China)

  • Liquan Dong, Beijing Institute of Technology (China)

Local Organizing Committee

  • Hongda Chen, Institute of Semiconductors, CAS (China)

  • Xuping Zhang, Nanjing University (China)

  • Shangzhong Jin, China Jiliang University (China)

  • Libo Yuan, Harbin Engineering University (China)

  • Yumei Wen, Chongqing University (China)

  • Tian Lan, Beijing Institute of Technology (China)

  • Cuiling Li, Beijing Institute of Technology (China)

Conference Committee

Conference Chairs

  • Baojun Li, Sun Yat-Sen University (China)

  • Xingjun Wang, Peking University (China)

  • Ya Sha Yi, University of Michigan (United States)

Program Committee

  • Renmin Ma, Peking University (China)

  • Di Liang, HP, Inc. (United States)

  • Daoxin Dai, Zhejiang University (China)

  • Hideo Isshiki, The University of Electro-Communications (Japan)

  • Yun-Feng Xiao, Peking University (China)

  • Chongjun Jin, Sun Yat-Sen University (China)

  • Yuchao Li, Jinan University (China)

  • Hongbao Xin, National University of Singapore (Singapore)

  • Youngfeng Mei, Fudan University (China)

  • Xiangping Li, Jinan University (China)

  • Weiwen Zou, Shanghai Jiao Tong University (China)

  • Bin Dong, Dalian Nationalities University (China)

  • Xiaochen Sun, LaXense, Inc. (United States)

  • Qiaoqiang Gan, University at Buffalo (United States)

  • Ruitao Wen, Massachusetts Institute of Technology (United States)


  • Haowen Shu, Peking University (China)

Session Chairs

  • 1 Micro/Nano Photonics

    Xingjun Wang, Peking University (China)

  • 2 Micro/Nano Photonics

    Baojun Li, Jinan University (China)

  • 3 Micro/Nano Photonics

    Lei Bi, University of Electronic Science and Technology of China (China)

  • 4 Micro/Nano Photonics

    Renmin Ma, Peking University (China)

  • 5 Micro/Nano Photonics

    Chongjun Jin, Sun Yat-Sen University (China)


Micro/Nano photonics is a rising interdisciplinary field which is focused on the study of the behavior of light on the micro/nano meter scale. It is considered a branch of optical engineering which deals with optics, or the interaction of light with particles or substances, at deep subwavelength length scales. Micro/Nano photonics can provide high bandwidth, high speed and ultra-small optoelectronic components. This technology has the potential to revolutionize telecommunications, computation, sensing, optical storage, optical display, optical manipulation, solar energy utilization, and lithography, etc.

With the importance of this technology in mind, the Micro/Nano photonics, Materials and Devices Conference of OIT 2017 was organized. The conference accepted over 50 papers from different countries/areas of the world, which are focused on the design, fabrication, and application of micro/nanostructures, and crossed many research disciplines including silicon photonics integration, active nanomaterials, plasmonics, biophotonics, nonlinear optics, nanostructure device, and fabrication technology. We also invited renowned scholars to present their cutting-edge breakthroughs. These experts and contributors added to an intellectually stimulating environment.

As the Conference Chairs, we would like to express our appreciation to the committee members for their support, to the presenters for devoting their precious time to writing intriguing articles, and to the reviewers for their helpful comments. We are also grateful to the staff of SPIE for their efforts in publishing these Proceedings.

Baojun Li

Xingjun Wang

Yasha Yi

Conference Organizers

Organized by

  • Opto-Electronic-Mechanic Technology and System Integration Chapter, CIS (China)

  • Committee on Optoelectronic Technology, COS (China)

  • Committee on Optics, China Ordnance Society (China)

  • Optical Instrument Chapter, CIS (China)

  • Beijing Institute of Technology (China)

  • Tianjin University (China)

  • Tsinghua University (China)

  • Peking University (China)

  • Nanjing University (China)

  • Shanghai Jiao Tong University (China)

  • Zhejiang University (China)

  • Nankai University (China)

  • Capital Normal University (China)

  • Beijing University of Posts and Telecommunications (China)

  • Chongqing University (China)

  • University of Shanghai for Science and Technology (China)

  • Instrument Society of America (United States)

  • Institute of Measurement and Control (United Kingdom)

  • Hong Kong Institution of Engineers (Hong Kong, China)

  • The Society of Measurement and Control (Japan)

© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 10622", Proc. SPIE 10622, 2017 International Conference on Optical Instruments and Technology: Micro/Nano Photonics: Materials and Devices, 1062201 (12 January 2018); doi: 10.1117/12.2317483; https://doi.org/10.1117/12.2317483

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