30 May 2018 Front Matter: Volume 10625
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 10625, including the Title Page, Copyright information, Table of Contents, and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX, edited by Gerald C. Holst, Keith A. Krapels, Proceedings of SPIE Vol. 10625 (SPIE, Bellingham, WA, 2018) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510617612

ISBN: 9781510617629 (electronic)

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Aleksandrov, Pavel, 0D

Almklov, Bernt, 0V

Arquetoux, Guillaume, 09

Artan, Göktuğ Gencehan, 12

Aubry, Gilles, 09

Baldwin, Kevin, 0J

Bek, Alpan, 12

Bernhardt, Sylvie, 08

Borg, Rodney A. J., 0C

Brendhagen, Erik, 0V

Brown, Andrea, 0J

Brown, David, 0J

Burks, Stephen D., 03, 04, 0A, 0B

Christol, Philippe, 08

Cordell, Chris, 0O

Correa, Elisabeth, 0G

Costard, Eric, 08

Derelle, Sophie, 08

Doe, Joshua M., 04, 0A

Driggers, Ronald, 0X, 0Y, 0Z, 11

Drost, Frank, 0C

Du Bosq, Todd W., 0T

Dunn, Conor, 0B

Durell, Christopher, 05

Familoni, Babajide O., 0T

Frascati, Joe, 0Z

Furxhi, Orges, 03, 0Y, 0Z, 11

Ghazi, Galia, 11

Glaholt, Mackenzie G., 0R

Glimsdal, Eirik, 0V

Graybeal, John J., 0L, 0T

Groenert, Michael, 0B

Haefner, David P., 03, 04, 06, 0A, 0B, 0K

Hanna, Randall, 0J

Heen, Lars T., 0V

Hixson, Jonathan G., 0J, 0L

Höglund, Linda, 08

Hollands, Justin G., 0R

Holst, Gerald C., 0U

Holt, Jeff, 05

Hovland, Harald, 07

Howell, Christopher L., 0Q

Huard, Edouard, 08

Hübner, M., 0P

Irwin, Alan, 02, 05

Jablonski, Joe, 05

Jaeck, Julien, 08

Kambhamettu, Chandra, 0H

Kermonde, Ian L., 0C

Kim, Charles C., 0G

Løkken, Kristin H., 0V

Madsen, Eirik Blix, 0N, 0V

Manser, Kimberly, 0Q

Miyanishi, Tomoya, 10

Mohammadian, Nafiseh, 11

Monfort, Samuel S., 0T

Moyer, Steven, 0J

Nghiem, Jean, 08

Nicholas, Robert, 0Y

Nielson, Kevin, 0O

Offermans, Peter, 11

Olson, Jeffrey, 0Q

Ozten, Metehan, 09

Pérez, José, 0I

Phelan, Brian, 0H

Pierson, Oliver, 0O

Preece, Bradley L., 10

Primot, Jérôme, 08

Prussing, Keith F., 0O

Rabade, Saurabh, 05

Repasi, Endre, 0I, 0M

Reynolds, Joseph P., 0E, 10

Ribet-Mohamed, Isabelle, 08

Richards, A., 0P

Saponaro, Philip Jr., 0H

Scheuch, Jonathan, 05

Scopatz, Stephen, 09

Shelton, David, 0Y

Sherbondy, Kelly, 0H

Short, Robert, 0X

Simingalam, Sina, 0E

Skauli, Torbjørn, 07

Snyder, Miguel, 0B

Stevens, James, 0B

Stewart, John, 0O

Taule, Petter, 0N

Teaney, Brian P., 0K

Thomassen, Jan Brede, 0N

Treible, Wayne, 0H

Turgut, Berk Berkan, 12

Vaitekunas, David A., 0D

van Rheenen, Arthur D., 0N, 0V

Vollmer, M., 0P

Vollmerhausen, Richard, 0X

Wegner, D., 0M

Wong, Rachel K., 0R

Zhang, Lei, 11

Conference Committee

Symposium Chair

  • Arthur A. Morrish, Raytheon Space and Airborne Systems (United States)

Symposium Co-chair

  • Ruth Moser, Air Force Research Laboratory (United States)

Conference Chairs

  • Gerald C. Holst, JCD Publishing (United States)

  • Keith A. Krapels, U.S. Army Night Vision & Electronic Sensors Directorate (United States)

Conference Program Committee

  • Gisele Bennett, Georgia Institute of Technology (United States)

  • Piet Bijl, TNO Defence, Security and Safety (Netherlands)

  • Katrin Braesicke, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • James A. Buford Jr., U.S. Army RDECOM AMRDEC (United States)

  • James A. Dawson, Dynetics, Inc. (United States)

  • Russell M. Drake, Raytheon Network Centric Systems (United States)

  • Ronald G. Driggers, St. Johns Optical Systems (United States)

  • Richard L. Espinola, U.S. Naval Research Laboratory (United States)

  • David P. Forrai, L-3 Communications Cincinnati Electronics (United States)

  • Orges Furxhi, St. Johns Optical Systems (United States)

  • David P. Haefner, U.S. Army RDECOM CERDEC NVESD (United States)

  • Jonathan G. Hixson, U.S. Army Night Vision & Electronic Sensors Directorate (United States)

  • Alan Irwin, Santa Barbara Infrared, Inc. (United States)

  • Eddie L. Jacobs, University of Memphis (United States)

  • Terrence S. Lomheim, The Aerospace Corporation (United States)

  • Endre Repasi, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Joseph P. Reynolds, U.S. Army RDECOM CERDEC NVESD (United States)

  • Nicolas Rivière, ONERA (France)

  • Michael A. Soel, FLIR Systems, Inc. (United States)

  • Andrew W. Sparks, L-3 Sonoma EO (United States)

  • Curtis M. Webb, L3 Technologies, Inc. (United States)

Session Chairs

  • 1 Test I

    Alan Irwin, Santa Barbara Infrared, Inc. (United States)

    Curtis M. Webb, L3 Technologies, Inc. (United States)

  • 2 Test II

    Alan Irwin, Santa Barbara Infrared, Inc. (United States)

    Curtis M. Webb, L3 Technologies, Inc. (United States)

  • 3 Systems

    James A. Buford Jr., U.S. Army RDECOM AMRDEC (United States)

    Russell M. Drake, Raytheon Missile Systems (United States)

    Andrew W. Sparks, L-3 Sonoma EO (United States)

  • 4 Modeling, Metrics, and Tools: Joint Session with conferences 10625 and 10650

    Richard L. Espinola, U.S. Naval Research Laboratory (United States)

    Katrin Braesicke, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

    Endre Repasi, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

    Nicolas Rivière, ONERA (France)

  • 5 Modeling I

    Dave Forrai, L-3 Cincinnati Electronics (United States)

    Orges Furxhi, St. Johns Optical Systems (United States)

  • 6 Modeling II

    Michael A. Soel, FLIR Systems, Inc. (United States)

    David P. Haefner, U.S. Army RDECOM CERDEC NVESD (United States)

    Jonathan G. Hixson, U.S. Army Night Vision & Electronic Sensors

    Directorate (United States)

  • 7 Modeling III

    James A. Dawson, Dynetics, Inc. (United States)

    Eddie L. Jacobs, University of Memphis (United States)

    Joseph P. Reynolds, U.S. Army REDCOM CERDEC NVESD (United States)

  • 8 Modeling IV

    Gisele Bennett, Georgia Institute of Technology (United States)

    Terrence S. Lomheim, The Aerospace Corporation (United States)

    Ronald G. Driggers, St. Johns Optical Systems (United States)

Introduction

This is the 29th year for our conference, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing. Over the years, we have witnessed the creation of IR focal plane arrays, IR scene projectors, MTF measurement techniques, and the Night Vision Integrated Performance Model (NVIPM). As government and private industry interests change, our conference has swings in the number of papers presented and attendees. It is interesting to note the most popular topics: A whole bunch of people come in to listen to a particular paper and then they leave after the paper.

From time to time, we have joint sessions with other conferences. This year, we teamed up with the Long-Range Imaging III conference chaired by Eric Kelmelis. Papers submitted to Eric’s conference will appear in Proceedings of SPIE Volume 10650.

In 2016, our conference committee created two BEST PAPER awards. One is based upon the presentation (selected by the conference committee) and the other the most downloaded in the first 3 months after publication. The most downloaded paper represents the current hot topic. We recommend readers review these outstanding papers.

We are proud to recognize:

2016

Best presentation

David P. Haefner, Brian P. Teaney, and Bradley L. Preece, “Modeling demosaicing of color corrected cameras in the NV-IPM,” Proceedings of SPIE Volume 9820, paper 982009 (2016)

Most downloaded paper (first 3 months after publication)

Daniel Wegner and Endre Repasi, “Image based performance analysis of thermal imagers,” Proceedings of SPIE Volume 9820, paper 982016. (2016).

2017

Best presentation

Austin A. Richards and Martin Hübner, “A new radiometric unit of measure to characterize SWIR illumination,” Proceedings of SPIE Volume 10178, paper 101780C (2017).

Most downloaded paper (first 3 months after publication) McKenna R. Lovejoy and Mark A. Wickert, “Testing of next-generation nonlinear calibration based non-uniformity correction techniques using SWIR devices.” Proceedings of SPIE Volume 10178, paper 1017803 (2017).

2018

Best presentation

David P. Haefner, “MTF measurements, identifying bias, and estimating uncertainty” Proceedings of SPIE Volume 10625, paper 1062506 (2018).

Most downloaded paper (first 3 months after publication)

Not available as of this writing. This information will be available in the frontmatter for this volume on SPIE’s Digital Library in late July, 2018:

https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/10625.toc

Thank you to all who presented, the attendees, and our excellent conference committee.

Gerald C. Holst

Keith A. Krapels

© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 10625", Proc. SPIE 10625, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX, 1062501 (30 May 2018); doi: 10.1117/12.2322382; https://doi.org/10.1117/12.2322382
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