On the relationships between higher and lower bit-depth system measurements

Stephen D. Burks; David P. Haefner; Joshua M. Doe

doi:10.1117/12.2305423

26 April 2018 On the relationships between higher and lower bit-depth system measurements

Stephen D. Burks, David P. Haefner, Joshua M. Doe

Proceedings Volume 10625, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX; 106250A (2018) https://doi.org/10.1117/12.2305423
Event: SPIE Defense + Security, 2018, Orlando, FL, United States

Abstract

The quality of an imaging system can be assessed through controlled laboratory objective measurements. Currently, all imaging measurements require some form of digitization in order to evaluate a metric. Depending on the device, the amount of bits available, relative to a fixed dynamic range, will exhibit quantization artifacts. From a measurement standpoint, measurements are desired to be performed at the highest possible bit-depth available. In this correspondence, we described the relationship between higher and lower bit-depth measurements. The limits to which quantization alters the observed measurements will be presented. Specifically, we address dynamic range, MTF, SiTF, and noise. Our results provide guidelines to how systems of lower bit-depth should be characterized and the corresponding experimental methods.

Citation Download Citation

Stephen D. Burks, David P. Haefner, and Joshua M. Doe "On the relationships between higher and lower bit-depth system measurements", Proc. SPIE 10625, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX, 106250A (26 April 2018); https://doi.org/10.1117/12.2305423

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