Translator Disclaimer
26 April 2018 On the relationships between higher and lower bit-depth system measurements
Author Affiliations +
The quality of an imaging system can be assessed through controlled laboratory objective measurements. Currently, all imaging measurements require some form of digitization in order to evaluate a metric. Depending on the device, the amount of bits available, relative to a fixed dynamic range, will exhibit quantization artifacts. From a measurement standpoint, measurements are desired to be performed at the highest possible bit-depth available. In this correspondence, we described the relationship between higher and lower bit-depth measurements. The limits to which quantization alters the observed measurements will be presented. Specifically, we address dynamic range, MTF, SiTF, and noise. Our results provide guidelines to how systems of lower bit-depth should be characterized and the corresponding experimental methods.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stephen D. Burks, David P. Haefner, and Joshua M. Doe "On the relationships between higher and lower bit-depth system measurements", Proc. SPIE 10625, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX, 106250A (26 April 2018);

Back to Top