13 June 1989 Scanning Tip Microscopy With Applications To Biology
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Proceedings Volume 1063, New Technologies in Cytometry; (1989) https://doi.org/10.1117/12.951893
Event: OE/LASE '89, 1989, Los Angeles, CA, United States
Abstract
Scanning tunneling microscopy and atomic force microscopy, denoted here scanning tip microscopy, are two powerful novel techniques for imaging surfaces with atomic resolution. We describe the underlying principles of these two techniques with special emphasis on an instrument developed in our laboratory that uses a laser diode to detect minute deflections of a tip as it raster scans the surface of a sample. Applications of these techniques to research in biology are assessed and their relative merits discussed.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dror Sarid, Dror Sarid, Edmond H. Thall, Edmond H. Thall, Douglas A. Iams, Douglas A. Iams, Jeffery T. Ingle, Jeffery T. Ingle, Tammy D. Henson, Tammy D. Henson, Y. C. Lee, Y. C. Lee, L. Stephen Bell, L. Stephen Bell, } "Scanning Tip Microscopy With Applications To Biology", Proc. SPIE 1063, New Technologies in Cytometry, (13 June 1989); doi: 10.1117/12.951893; https://doi.org/10.1117/12.951893
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