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Author(s), “Title of Paper,” in Anomaly Detection and Imaging with X-Rays (ADIX) III, edited by Amit Ashok, Joel A. Greenberg, Michael E. Gehm, Mark A. Neifeld, Proceedings of SPIE Vol. 10632 (SPIE, Bellingham, WA, 2018) Seven-digit Article CID Number.
ISSN: 1996-756X (electronic)
ISBN: 9781510617766 (electronic)
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Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.
Ashok, Amit, 04, 0F
Babaheidarian, Parisa, 0D
Bilgin, Ali, 04
Carin, Lawrence, 03
Carlson, David, 03
Castañón, David A., 0D
Chandrasekaran, Hema, 0E
Coccarelli, David, 0F
Diallo, Souleymane O., 03, 09
Gehm, Michael, 0F
Greenberg, Joel A., 05, 09, 0B, 0F
Gregory, Christopher, 03, 09
Hazineh, Dean, 0B
Heilmann, Geert, 03
Keohane, Brian, 0B
Liang, Kevin J., 03
MacGibbon, Chris, 0B
Mandava, Sagar, 04
Martz, Harry E., 0E
Masoudi, Ahmad, 0F
Paglieroni, David W., 0E
Pechard, Christian, 0E
Roe, Kris, 03, 09
Sigman, John B., 03
Spell, Gregory P., 03
Tadlock, K., 09
Thamvichai, Ratchaneekorn, 0F
Voris, Jay, 0F
Wolter, Scott, 05, 09, 0B
Zhao, Bi, 05
Amit Ashok, College of Optical Sciences, The University of Arizona (United States)
Joel A. Greenberg, Duke University (United States)
Michael E. Gehm, Duke University (United States)
Mark A. Neifeld, The University of Arizona (United States)
Conference Program Committee
Mark A. Anastasio, Washington University in St. Louis (United States)
Ali Bilgin, The University of Arizona (United States)
Ali Can, GE Global Research (United States)
Eric W. Clarkson, The University of Arizona (United States)
Mini Das, University of Houston (United States)
Edward D. Franco, Rapiscan Systems Inc. (United States)
Christopher W. Gregory, Smiths Detection Inc. (United States)
Tim E. Harvey, EMF Corporation (United States)
Kris Iniewski, Redlen Technologies (Canada)
Harry E. Martz, Lawrence Livermore National Laboratory (United States)
Joseph A. O'Sullivan, Washington University in St. Louis (United States)
Sean Pang, CREOL, The College of Optics and Photonics, University of Central Florida (United States)
Lei Tian, University of California, Berkeley (United States)
Laura Waller, University of California, Berkeley (United States)
Sharene Young, U.S. Department of Homeland Security (United States)