Paper
14 May 2018 A speckle-based approach to compressive hyperspectral imaging
Rebecca French, Sylvain Gigan, Otto L. Muskens
Author Affiliations +
Abstract
Incorporating wavelength information into a monochrome image is of great interest for imaging spectroscopy. Here, we show that by exploiting the properties of multiple scattering materials, we can encode spectral information in a CMOS image, where the spectral resolution obtained is only limited by the scattering strength of the material. As a proof-of-concept, we demonstrate this technique using a thin multiple scattering layer of gallium phosphide nanowires and a microlens array. We achieve a spectral resolution of approximately 4 nm and a reconstructed image containing 64 pixels. We demonstrate that a computational technique which is commonly used in compressive sensing can be used to reconstruct both sparse and dense spectra, when undersampling and oversampling a signal, respectively. This method provides an ultra-compact solution to obtaining both spatial and spectral information in one measurement, for potential use in portable spectroscopy.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rebecca French, Sylvain Gigan, and Otto L. Muskens "A speckle-based approach to compressive hyperspectral imaging", Proc. SPIE 10657, Next-Generation Spectroscopic Technologies XI, 106570R (14 May 2018); https://doi.org/10.1117/12.2303993
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Speckle pattern

Spectrometers

Multiple scattering

Nanowires

Spectral resolution

Hyperspectral imaging

Image transmission

Back to Top