21 May 2018 Correlation plenoptic imaging with entangled photons
Author Affiliations +
Abstract
Plenoptic imaging (PI) is an optical technique to perform three-dimensional imaging in a single shot. It is enabled by the simultaneous measurement of both the location and the propagation direction of light in a given scene. Despite being very useful for extending the depth of field, such technique entails a strong trade- off between spatial and angular resolution. This makes the resolution and the maximum achievable depth of focus inversely proportional; hence, resolution cannot be diffraction-limited. We have recently proposed a new procedure, called Correlation Plenoptic Imaging (CPI), to overcome such fundamental limits by collecting plenoptic information through intensity correlation measurement. Using two correlated beams, from either a chaotic or an entangled photon source, we perform imaging in one arm and simultaneously obtain the angular information in the other arm. In this paper, we discuss the case in which the two correlated beams of light are generated by spontaneous parametric down-conversion. We review the principles of CPI with entangled photons and discuss its resolution and depth-of-field limits.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Francesco Di Lena, Francesco Di Lena, Francesco V. Pepe, Francesco V. Pepe, Alessio Avella, Alessio Avella, Ivano Ruo-Berchera, Ivano Ruo-Berchera, Giuliano Scarcelli, Giuliano Scarcelli, Augusto Garuccio, Augusto Garuccio, Milena D'Angelo, Milena D'Angelo, } "Correlation plenoptic imaging with entangled photons", Proc. SPIE 10674, Quantum Technologies 2018, 106740H (21 May 2018); doi: 10.1117/12.2307836; https://doi.org/10.1117/12.2307836
PROCEEDINGS
6 PAGES + PRESENTATION

SHARE
RELATED CONTENT

Multi-aperture approach to digital color night vision
Proceedings of SPIE (May 05 2017)
Correlation plenoptic imaging
Proceedings of SPIE (June 26 2017)
Evaluation of the microscanning process
Proceedings of SPIE (October 17 1994)

Back to Top