24 May 2018 Two-step phase shifting in fringe projection: modeling and analysis
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Abstract
This work proposes a two-step phase-shifting algorithm as an improvement of fringe projection profilometry. Considering the working process of fringe projection, the captured fringe image is formulated with two variables, i.e. surface reflectivity and phase value. And a phase shift of 3π/2 is introduced to get the two-step phase-shifting. After appropriate variable substitution, expressions of two fringe images can be transformed into two equations corresponding to a line and a circle respectively. With this circle-line model, the characteristic of solution and the phase error due to non-zero ambient light are analyzed. Then the approach of error compensation is proposed based on estimation of the real fringe contrast and non-linear least square optimization. The validity of the proposed approach is demonstrated with both simulations and experiments.
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Jiaqi Mao, Jiaqi Mao, Yongkai Yin, Yongkai Yin, Xiangfeng Meng, Xiangfeng Meng, Xiulun Yang, Xiulun Yang, Lei Lu, Lei Lu, Dechun Li, Dechun Li, Christian Pape, Christian Pape, Eduard Reithmeier, Eduard Reithmeier, } "Two-step phase shifting in fringe projection: modeling and analysis", Proc. SPIE 10678, Optical Micro- and Nanometrology VII, 106780V (24 May 2018); doi: 10.1117/12.2306641; https://doi.org/10.1117/12.2306641
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