Another issue to be addressed is the reliability of the simple circuit models to extract accurate circuit component values, especially when the deviation between the measured microwave reflection coefficient S11(f) and the fitted model is substantially large. This discrepancy is due to the oversimplification imposed on the equivalent circuit model, leading to a high level of uncertainty in the extracted circuit component values. Thus, sufficient modelling and accurate fitting strategies are needed for a reliable parasitic de-embedding approach.
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Wissam Hamad, Nataly Dalal, Serena Bou Nassar, Marwan Bou Sanayeh, Mustapha Hamad, Werner Hofmann, "De-embedding device parasitics of ultra-high speed VCSELs," Proc. SPIE 10682, Semiconductor Lasers and Laser Dynamics VIII, 106821T (9 May 2018);