17 May 2018 Exploiting silicon oxycarbides for integrated photonic applications
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We report on the characteristics of silicon oxycarbide films deposited by reactive radio frequency magnetron sputtering of a silicon carbide target in the presence of argon and oxygen gases. Quantitative characterization of the silicon oxycarbide films is performed extensively by ellipsometry, scanning electron microscopy and atomic force microscopy. Integrated photonic waveguides are demonstrated in silicon oxycarbide films.
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Faisal Ahmed Memon, Faisal Ahmed Memon, Francesco Morichetti, Francesco Morichetti, Andrea Melloni, Andrea Melloni, "Exploiting silicon oxycarbides for integrated photonic applications", Proc. SPIE 10683, Fiber Lasers and Glass Photonics: Materials through Applications, 106832T (17 May 2018); doi: 10.1117/12.2306624; https://doi.org/10.1117/12.2306624

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