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21 June 2018 Front Matter: Volume 10692
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 10692, including the Title Page, Copyright information, Table of Contents, and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Optical Fabrication, Testing, and Metrology VI, edited by Sven Schröder, Roland Geyl, Proceedings of SPIE Vol. 10692 (SPIE, Bellingham, WA, 2018) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510619210

ISBN: 9781510619227 (electronic)

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Achour, Sakina, 19

Aguirre Aguirre, Daniel, 16

Aguirre-Caro, Jesús Alberto, 1J

Angervaks, A. E., 08

Armengol-Cruz, Victor Emanuel, 16

Arnold, Thomas, 0M

Banasch, Michael, 0I

Barré, Frédéric, 0D

Bauer, Jens, 0M

Béguelin, Jeremy, 07

Beier, Matthias, 0K

Belyaeva, Alina, 1G

Bernal, A., 1F

Berruée, Romain, 0D

Beutler, Andreas, 0O

Blalock, Todd, 0L

Brunelle, Matthew, 0L

Burkhardt, Matthias, 0H

Butova, Daria, 1G

Camargo-Fierro, Christian, 16

Campos-García, Manuel, 16, 1J

Chang, Keng-Shou, 1D

Chaussat, G., 0X

Chen, Fong-Zhi, 0Q

Cheng, Xinbin, 0E

Cheng, Yuan-Chieh, 0Q

Chou, Hsiao-Yu, 0Q

Cloutrier, Christophe, 0D

Dambon, Olaf, 0Y, 0Z, 10

Damm, Christoph, 0C

Dannberg, Peter, 06

DeGroote Nelson, Jessica, 0L

Díaz-Uribe, José Rufino, 1J

Diehl, Torsten, 0H

Doan, Van Bak, 08

Doetz, Marius, 0Y, 0Z, 10

Erdmann, Lars H., 0H

Espinoza-Nava, Ulises, 1J

Etcheto, Pierre, 19

Faehnle, Oliver, 0Y, 0Z, 10, 11

Feng, Lei, 1H

Ferralli, Ian, 0L

Fischer, Stephanie, 06

Flatt, Holger, 1K

Flebus, Carlo, 0B

Flügel-Paul, Thomas, 0I

Ganesan, A. R., 1F

Gatto, Alexandre, 0H

Geyl, R., 0A, 0X

Gloesener, Pierre, 0B

Gorokhovsky, K. S., 08

Granovskii, V. A., 08

Hahne, F., 03

Haret, Laurent-Daniel, 0D

Hartmann, Peter, 04

Hartung, Johannes, 0C, 0K

Haumont, Thierry, 0D

Heidler, Nils, 0C

Heusinger, Martin, 0I

Hilpert, Enrico, 0C

Houllier, Thomas, 0P

Huang, Chien-Yao, 1D

Hugues, Vincent, 0D

Ilinski, Aleksandr V., 17

Ivanov, S. A., 08

Jasperneite, Jürgen, 1K

Jiao, Hongfei, 0E

Jing, Juanjuan, 1H

Joenathan, C., 1F

Joseph, S., 02

Kalies, Alexander, 0H

Khaled, Abou-El-Hossein, 0Q

Kleinle, Sylke, 06

Klocke, F., 0Z, 10

Koch, Felix, 0H

Koszo, Manon, 0D

Kozhina, Anastasia, 1G

Kroneberger, Monika, 0G

Kuo, Ching-Hsiang, 1D

Kuperman-Le Bihan, Quentin, 19

Langehanenberg, P., 03

Langenbach, Eckhard, 0Y, 10

Lehr, Dennis, 0H

Leitel, Robert, 06

Lemagne, Fabien, 0B

Lépine, Thierry, 0P

Leplan, H., 0A, 0X

Levy, A., 02

Li, Hongyu, 0N

Li, Tony, 0N

Li, Yacan, 1H

Lopez, S., 0A

Lousberg, Grégory P., 0B

Lyamets, Dmitry, 1G

Lynch, Timothy, 0L

Maltseva, Nadezhda K., 17

Mezger, Andreas, 0G

Michaelis, Dirk, 0I

Miks, Antonin, 1E

Moeller, Tobias, 0H

Monaci, Denis, 0D

Monamy, Virgile, 0B

Moreau, Fabien, 0D

Nikonorov, N. V., 08

Noell, Wilfried, 07

Novak, Jiri, 1E

Novak, Pavel, 1E

Nurpeisova, Diana, 1G

Okun, R. A., 08

Orekhova, Maria K., 1G

Peña-Conzuelo, Andrés, 1J

Peng, Wei-Jei, 0Q

Perezyabov, Oleg A., 17

Pesch, Alexander, 0H

Peschel, Thomas, 0C

Pietag, Fred, 0M

Pirnay, Olivier, 0B

Plachta, Kamil, 1C

Plainchamp, Bertrand, 0D

Pokorny, Petr, 1E

Pretheesh Kumar, V. C., 1F

Rascher, R., 0Z, 11

Reynolds, Christina, 0N

Rieth, Katja, 0B

Riguet, Francois, 0A, 0D

Risse, Stefan, 0C, 0K

Rodolfo, Jacques, 0D

Rousselet, Nicolas, 0P

Ruch, E., 0A

Ryskin, A. I., 08

Sachkov, Mikhail, 09

Scharf, Toralf, 07

Schneider, Daniel, 1K

Schreiber, Peter, 06

Schröder, Sven, 0E

Shinman-Avraham, A. E., 02

Shu, Shyu-Cheng, 1D

Smejkal, Filip, 1E

Smejkal, Michal, 1E

Stübbe, Oliver, 1K

Surrel, Yves, 0P

Tolstoba, Nadezhda, 1G

Triebel, Peter, 0H

Trost, Marcus, 0E

Ulitschka, Melanie, 0M

Voelkel, Reinhard, 07

Vogt, C., 0Z, 11

Volatier, Jean-Baptiste, 0G

von Lukowicz, Henrik, 0C

Wächter, Christoph, 06

Walker, David, 0N

Wang, Zhanshan, 0E

Weber, Y. B., 02

Wei, Lidong, 1H

Yadlovker, D., 02

Yang, Lei, 1H

Yu, Guoyu, 0N

Yu, Zong-Ru, 1D

Zavatskaya, Ksenia, 1G

Zeitner, Uwe D., 0I

Zhang, Jinlong, 0E

Zhang, Lei, 0E

Zhang, Wang, 0N

Zheng, Xiao, 0N

Zhou, Jinsong, 1H

Zomerstein, S., 02

Conference Committee

Symposium Chair

  • Wilhelm Ulrich, Carl Zeiss AG (Germany)

Symposium Co-chairs

  • Juan Carlos Miñano, Universidad Politécnica de Madrid (Spain)

  • David M. Williamson, Nikon Research Corporation of America (United States)

Honorary Symposium Chair

  • Tina E. Kidger, Kidger Optics Associates (United Kingdom)

Conference Chairs

  • Sven Schröder, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • Roland Geyl, Safran Reosc (France)

Conference Programme Committee

  • Xinbin Cheng, Tongji University (China)

  • Sead Doric, Doric Lenses Inc. (Canada)

  • Angela Duparré, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • Oliver W. Fähnle, FISBA AG (Switzerland)

  • Pierre Gloesener, AMOS Ltd. (Belgium)

  • Philippe Godefroy, Winlight System S.A. (France)

  • James E. Harvey, Photon Engineering LLC (United States)

  • François Houbre, Savimex (France)

  • Shay Joseph, Rafael Advanced Defense Systems Ltd. (Israel)

  • Sven R. Kiontke, asphericon GmbH (Germany)

  • François Leprêtre, Thales Angénieux S.A. (France)

  • Jérôme Néauport, Commissariat à l’Énergie Atomique (France)

  • Miloslav Ohlídal, Brno University of Technology (Czech Republic)

  • Manfred Prantl, Alicona Imaging GmbH (Austria)

  • Reinhard Völkel, SUSS MicroOptics SA (Switzerland)

  • Lingli Wang, Jos. Schneider Optische Werke GmbH (Germany)

  • Alexander Yascovich, Space Research Institute (Russian Federation)

Session Chairs

  • 1 Optical Systems

    Peter Hartmann, SCHOTT AG (Germany)

  • 2 Microoptics

    Reinhard Völkel, SUSS MicroOptics SA (Switzerland)

  • 3 Space Optics

    Monika Kroneberger, OHB-System AG (Germany)

  • 4 Gratings and Functional Surfaces

    Robert Leitel, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • 5 Freeforms

    Pierre Gloesener, AMOS Ltd. (Belgium)

    Francois Riguet, Safran Reosc (France)

  • 6 Low-Loss Optics and Metrology

    Sven Schröder, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • 7 Optical Fabrication

    Roland Geyl, Safran Reosc (France)

  • 8 Metrology I

    Myriam Zerrad, Institut Fresnel (France)

  • 9 Metrology II

    Christof Pruss, Institut für Technische Optik (Germany)

© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 10692", Proc. SPIE 10692, Optical Fabrication, Testing, and Metrology VI, 1069201 (21 June 2018); doi: 10.1117/12.2503246; https://doi.org/10.1117/12.2503246
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