20 February 2018 Pulse shaping system research of CdZnTe radiation detector for high energy x-ray diagnostic
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As one of the typical wide band-gap semiconductor materials, the CdZnTe material has high detection efficiency and excellent energy resolution for the hard X-ray and the Gamma ray. The generated signal of the CdZnTe detector needs to be transformed to the pseudo-Gaussian pulse with a small impulse-width to remove noise and improve the energy resolution by the following nuclear spectrometry data acquisition system. In this paper, the multi-stage pseudo-Gaussian shaping-filter has been investigated based on the nuclear electronic principle. The optimized circuit parameters were also obtained based on the analysis of the characteristics of the pseudo-Gaussian shaping-filter in our following simulations. Based on the simulation results, the falling-time of the output pulse was decreased and faster response time can be obtained with decreasing shaping-time τs-k. And the undershoot was also removed when the ratio of input resistors was set to 1 to 2.5. Moreover, a two stage sallen-key Gaussian shaping-filter was designed and fabricated by using a low-noise voltage feedback operation amplifier LMH6628. A detection experiment platform had been built by using the precise pulse generator CAKE831 as the imitated radiation pulse which was equivalent signal of the semiconductor CdZnTe detector. Experiment results show that the output pulse of the two stage pseudo-Gaussian shaping filter has minimum 200ns pulse width (FWHM), and the output pulse of each stage was well consistent with the simulation results. Based on the performance in our experiment, this multi-stage pseudo-Gaussian shaping-filter can reduce the event-lost caused by pile-up in the CdZnTe semiconductor detector and improve the energy resolution effectively.
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Miao Li, Miao Li, Mingkun Zhao, Mingkun Zhao, Keyu Ding, Keyu Ding, Shousen Zhou, Shousen Zhou, Benjie Zhou, Benjie Zhou, } "Pulse shaping system research of CdZnTe radiation detector for high energy x-ray diagnostic", Proc. SPIE 10697, Fourth Seminar on Novel Optoelectronic Detection Technology and Application, 106971H (20 February 2018); doi: 10.1117/12.2314714; https://doi.org/10.1117/12.2314714


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