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10 July 2018 High precision metrology for large bandpass filters
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Abstract
High precision measurements of the filters bandpass used on wide-field imagers mounted on large telescopes is critical for type Ia supernovae studies. A dedicated spectrophotometric bench is used to re-measure the now decommissioned ugriz filters used for the SNLS on CFHT-MegaCam. A full characterization of the optical response with respect to the location on the surface and the angle of incidence was performed for each filter. Strong variation over the filter surface is observed. The impact of the actual response on the observation is evaluated and we demonstrate an improvement with respect to the previous published results (SNLS1 and 2).
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. Sassolas, M. Betoule, N. Regnault, B. Lagrange, D. Hofman, L. Balzarini, L. Pinard, D. Forest, G. Cagnoli, J.-C. Cuillandre, and T. Benedict "High precision metrology for large bandpass filters", Proc. SPIE 10706, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III, 107064E (10 July 2018); https://doi.org/10.1117/12.2312003
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