Translator Disclaimer
10 July 2018 Characterization of the reflectivity of various black materials II
Author Affiliations +
We report on an expanded catalog of total and specular reflectance measurements of various common (and uncommon) materials used in the construction and/or baffling of optical systems. Total reflectance is measured over a broad wavelength range (250 nm < λ < 2500 nm) that is applicable to ultraviolet, visible, and near-infrared instrumentation. Characterization of each sample's specular reflection was measured using a helium-neon laser in two degree steps from near normal to grazing angles of incidence. The total and specular reflection measurements were then used to derive the specular fraction of each material.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Luke M. Schmidt, Madelynn Gomez, Doyeon Kim, Michael Torregosa, Marcus Sauseda, Travis Prochaska, D. L. DePoy, J. L. Marshall, Lawrence Gardner, and Walter Grant "Characterization of the reflectivity of various black materials II", Proc. SPIE 10706, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III, 107065E (10 July 2018);

Back to Top