Characterization of the reflectivity of various white materials

Luke M. Schmidt; Madelynn Gomez; Doyeon Kim; Michael Torregosa; Marcus Sauseda; Travis Prochaska; D. L. DePoy; J. L. Marshall; Lawrence Gardner; Walter Grant

doi:10.1117/12.2312365

10 July 2018 Characterization of the reflectivity of various white materials

Luke M. Schmidt, Madelynn Gomez, Doyeon Kim, Michael Torregosa, Marcus Sauseda, Travis Prochaska, D. L. DePoy, J. L. Marshall, Lawrence Gardner, Walter Grant

Author Affiliations +

Proceedings Volume 10706, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III; 107065F (2018) https://doi.org/10.1117/12.2312365
Event: SPIE Astronomical Telescopes + Instrumentation, 2018, Austin, Texas, United States

Abstract

We present total reflectance measurements and Lambertian characterization of various materials that are commonly (and uncommonly) used as a screen for imaging system calibration (such as flat fielding). We measure the total reflectance of the samples over a broad wavelength range (250 nm < λ < 2500 nm) that is of interest to astronomical instruments in the ultraviolet, visible, and near-infrared regimes. A Helium-Neon laser was used to determine how closely the various materials' diffuse reflectance characteristics match that of a Lambertian surface.

Citation Download Citation

Luke M. Schmidt, Madelynn Gomez, Doyeon Kim, Michael Torregosa, Marcus Sauseda, Travis Prochaska, D. L. DePoy, J. L. Marshall, Lawrence Gardner, and Walter Grant "Characterization of the reflectivity of various white materials", Proc. SPIE 10706, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III, 107065F (10 July 2018); https://doi.org/10.1117/12.2312365

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